Wu, Y., Li, H., He, Y., Li, J., Su, H., Shi, C., . . . Zhang, M. (2024). A Vectorial Current Density Visual Inspection Method for IGBT Modules. IEEE transactions on electron devices, 71(9), 5565-5572. https://doi.org/10.1109/TED.2024.3427100
Chicago Style (17th ed.) CitationWu, Yangjing, Hangcheng Li, Yichen He, Jing Li, Huiyi Su, Chengyu Shi, Wenwei Zhang, and Mingji Zhang. "A Vectorial Current Density Visual Inspection Method for IGBT Modules." IEEE Transactions on Electron Devices 71, no. 9 (2024): 5565-5572. https://doi.org/10.1109/TED.2024.3427100.
MLA (9th ed.) CitationWu, Yangjing, et al. "A Vectorial Current Density Visual Inspection Method for IGBT Modules." IEEE Transactions on Electron Devices, vol. 71, no. 9, 2024, pp. 5565-5572, https://doi.org/10.1109/TED.2024.3427100.