A Fast Logic Mapping Algorithm for Multiple-Type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays - Tunali, Onur; Altun, Mustafa (IEEE transactions on emerging topics in computing, 2019)
Keywords: Algorithm design and analysis; Algorithms; Arrays; Circuit design; Classification; CMOS; Computer simulation; defect tolerance; Defects; Frequency modulation; Heuristic methods; Logic; Logic functions; Mapping; Matching; Morphing; Multiplication; Nanoscale devices; Programmable logic arrays; Reconfigurable nano-crossbars; Sorting; Sorting algorithms; Switches; switching arrays