Optimization of Electric Stress in a Vacuum Interrupter Using Charnes' Big M Algorithm

This article presents the optimization of electric stress distribution over the live electrode of an axisymmetric vacuum interrupter which is employed for 11 kV switching operations. The optimization is carried out by a classical approach using Charnes' Big M algorithm used for solving constrai...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on dielectrics and electrical insulation Vol. 30; no. 2; pp. 877 - 882
Main Authors Dasgupta, Suryendu, Baral, Arijit, Lahiri, Abhijit
Format Journal Article
LanguageEnglish
Published New York IEEE 01.04.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN1070-9878
1558-4135
DOI10.1109/TDEI.2022.3231224

Cover

Abstract This article presents the optimization of electric stress distribution over the live electrode of an axisymmetric vacuum interrupter which is employed for 11 kV switching operations. The optimization is carried out by a classical approach using Charnes' Big M algorithm used for solving constrained linear programming problems (LPPs). For this purpose, the objective function is obtained by applying multiple linear regression analysis by which a mathematical relationship between the maximum resultant electric field intensity (<inline-formula> <tex-math notation="LaTeX">{E}^{\text {max}} </tex-math></inline-formula>) over the surface of the live electrode and the critical dimensions affecting this stress. For this purpose, a set of 173 data is used which is prepared by varying the critical dimensions within the constraints of the overall dimension of the system and calculating the value of <inline-formula> <tex-math notation="LaTeX">{E}^{\text {max}} </tex-math></inline-formula> over the surface of the live electrode by employing the boundary element method (BEM).
AbstractList This article presents the optimization of electric stress distribution over the live electrode of an axisymmetric vacuum interrupter which is employed for 11 kV switching operations. The optimization is carried out by a classical approach using Charnes' Big M algorithm used for solving constrained linear programming problems (LPPs). For this purpose, the objective function is obtained by applying multiple linear regression analysis by which a mathematical relationship between the maximum resultant electric field intensity (<inline-formula> <tex-math notation="LaTeX">{E}^{\text {max}} </tex-math></inline-formula>) over the surface of the live electrode and the critical dimensions affecting this stress. For this purpose, a set of 173 data is used which is prepared by varying the critical dimensions within the constraints of the overall dimension of the system and calculating the value of <inline-formula> <tex-math notation="LaTeX">{E}^{\text {max}} </tex-math></inline-formula> over the surface of the live electrode by employing the boundary element method (BEM).
This article presents the optimization of electric stress distribution over the live electrode of an axisymmetric vacuum interrupter which is employed for 11 kV switching operations. The optimization is carried out by a classical approach using Charnes’ Big M algorithm used for solving constrained linear programming problems (LPPs). For this purpose, the objective function is obtained by applying multiple linear regression analysis by which a mathematical relationship between the maximum resultant electric field intensity ([Formula Omitted]) over the surface of the live electrode and the critical dimensions affecting this stress. For this purpose, a set of 173 data is used which is prepared by varying the critical dimensions within the constraints of the overall dimension of the system and calculating the value of [Formula Omitted] over the surface of the live electrode by employing the boundary element method (BEM).
Author Baral, Arijit
Lahiri, Abhijit
Dasgupta, Suryendu
Author_xml – sequence: 1
  givenname: Suryendu
  surname: Dasgupta
  fullname: Dasgupta, Suryendu
  email: suryendu.skfgi@gmail.com
  organization: Department of Electrical Engineering, IIT (ISM) Dhanbad, Dhanbad, India
– sequence: 2
  givenname: Arijit
  orcidid: 0000-0002-1905-9059
  surname: Baral
  fullname: Baral, Arijit
  email: arijit@iitism.ac.in
  organization: Department of Electrical Engineering, IIT (ISM) Dhanbad, Dhanbad, India
– sequence: 3
  givenname: Abhijit
  orcidid: 0000-0001-8202-883X
  surname: Lahiri
  fullname: Lahiri, Abhijit
  email: jit_lahiri@yahoo.com
  organization: MCKV Institute of Engineering, Howrah, India
BookMark eNo9kE1PAjEQhhuDiYD-AOOliQdPi_2k7RERlQTDQeTalDILJeyH7e5Bf71LMF5m5vC87yTPAPXKqgSEbikZUUrM4-p5Nh8xwtiIM04ZExeoT6XUmaBc9rqbKJIZrfQVGqR0IIQKycZ9tF7WTSjCj2tCVeIqx7Mj-CYGjz-aCCnhUGKH1863bYHnZQMxtnU38WcK5Q5P9y6WkB7wU9jhdzw57qoYmn1xjS5zd0xw87eHaPUyW03fssXydT6dLDLPhGwyvlEGBNVEKSKF32qhBfE5MZpsFJeacu0VaAe5ziUfQw6ObhVRAEqCG_Mhuj_X1rH6aiE19lC1sew-WqYMZ1R23R1Fz5SPVUoRclvHULj4bSmxJ3v2ZM-e7Nk_e13m7pwJAPDPG2OE4ob_Aj6ZbA0
CODEN ITDIES
Cites_doi 10.1109/tdei.2007.344616
10.1109/tmag.2006.872479
10.1109/deiv.2006.357218
10.1109/tdei.2011.5931075
10.1109/tpas.1974.293898
10.1109/tpwrd.2004.843457
10.1109/94.919908
10.1109/tdei.2004.1387819
10.1201/b20012-98
10.1109/tei.1987.298964
10.1109/94.671944
10.1109/tei.1986.348962
10.1109/tdei.2022.3173521
10.1109/tmag.2006.871373
10.1109/59.627835
10.1109/tmag.1970.1066924
10.1109/20.312549
10.1109/tdei.2013.6633729
10.1109/tpas.1973.293692
10.1109/94.971456
10.1109/94.993730
10.1109/94.556552
10.1109/tdei.2008.4656256
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/TDEI.2022.3231224
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1558-4135
EndPage 882
ExternalDocumentID 10_1109_TDEI_2022_3231224
9994739
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
RXW
TAE
TAF
TN5
VH1
AAYXX
CITATION
7SP
8FD
L7M
ID FETCH-LOGICAL-c245t-3b79e418077054cd84840cf0980b7358138c7e8aef8f536efea1d707ee75ea63
IEDL.DBID RIE
ISSN 1070-9878
IngestDate Mon Jun 30 10:18:32 EDT 2025
Wed Oct 01 01:11:10 EDT 2025
Wed Aug 27 02:49:16 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 2
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c245t-3b79e418077054cd84840cf0980b7358138c7e8aef8f536efea1d707ee75ea63
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0001-8202-883X
0000-0002-1905-9059
PQID 2793215180
PQPubID 75745
PageCount 6
ParticipantIDs ieee_primary_9994739
crossref_primary_10_1109_TDEI_2022_3231224
proquest_journals_2793215180
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2023-April
2023-4-00
20230401
PublicationDateYYYYMMDD 2023-04-01
PublicationDate_xml – month: 04
  year: 2023
  text: 2023-April
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on dielectrics and electrical insulation
PublicationTitleAbbrev T-DEI
PublicationYear 2023
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref23
ref15
ref14
ref20
ref11
ref22
ref10
ref21
ref2
ref1
ref17
ref16
ref19
ref18
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref13
  doi: 10.1109/tdei.2007.344616
– ident: ref19
  doi: 10.1109/tmag.2006.872479
– ident: ref21
  doi: 10.1109/deiv.2006.357218
– ident: ref18
  doi: 10.1109/tdei.2011.5931075
– ident: ref3
  doi: 10.1109/tpas.1974.293898
– ident: ref12
  doi: 10.1109/tpwrd.2004.843457
– ident: ref10
  doi: 10.1109/94.919908
– ident: ref11
  doi: 10.1109/tdei.2004.1387819
– ident: ref14
  doi: 10.1201/b20012-98
– ident: ref16
  doi: 10.1109/tei.1987.298964
– ident: ref5
  doi: 10.1109/94.671944
– ident: ref6
  doi: 10.1109/tei.1986.348962
– ident: ref7
  doi: 10.1109/tdei.2022.3173521
– ident: ref17
  doi: 10.1109/tmag.2006.871373
– ident: ref9
  doi: 10.1109/59.627835
– ident: ref1
  doi: 10.1109/tmag.1970.1066924
– ident: ref4
  doi: 10.1109/20.312549
– ident: ref23
  doi: 10.1109/tdei.2013.6633729
– ident: ref2
  doi: 10.1109/tpas.1973.293692
– ident: ref15
  doi: 10.1109/94.971456
– ident: ref22
  doi: 10.1109/94.993730
– ident: ref8
  doi: 10.1109/94.556552
– ident: ref20
  doi: 10.1109/tdei.2008.4656256
SSID ssj0014526
Score 2.3838727
Snippet This article presents the optimization of electric stress distribution over the live electrode of an axisymmetric vacuum interrupter which is employed for 11...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Index Database
Publisher
StartPage 877
SubjectTerms Algorithms
Boundary element method
Charnes’ Big M algorithm
Constraints
Electric fields
Electrodes
Interrupters
Linear programming
Mathematical models
multiple linear regression
Optimization
Regression analysis
Stress
Stress distribution
vacuum interrupter
Title Optimization of Electric Stress in a Vacuum Interrupter Using Charnes' Big M Algorithm
URI https://ieeexplore.ieee.org/document/9994739
https://www.proquest.com/docview/2793215180
Volume 30
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Xplore
  customDbUrl:
  eissn: 1558-4135
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014526
  issn: 1070-9878
  databaseCode: RIE
  dateStart: 19940101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEB5UEPTgW1xf5CAIYte0SZv06GNFBfXgKt5Km0510d2Vtb34652k3cXXwUvpIYGQSWa-yXwzA7DH8ygipJx7gaFLLsPY91KVFV6BKswEpuijY_neRBf38uoxfJyCw0kuDCI68hm27a-L5edDU9mnsiMCM1KJeBqmlY7qXK1JxMC2yq75hdwjP1o3EUyfx0fds84leYJB0BaEZoJAfrNBrqnKL03szMv5IlyPF1azSl7aVZm1zcePmo3_XfkSLDQ4kx3XB2MZpnCwAvNfqg-uwKxjf5r3VXi4JcXRbzIy2bBgHdccp2fYnUslYb0BS9lDaqqqz9wb4qh6oy9zhANmQ_akMffZSe-JXbPj16fhqFc-99ege97pnl54TcMFzwQyLD2RqRilr7lShORMriW5f6bgseaZsoXShDYKdYqFLkIRYYGpnyuukASLaSTWYWYwHOAGMBpA0I_QKMZCEqbJcp-ssfTTgOtMyLgFB2MJJG91WY3EuSM8Tqy4EiuupBFXC1btjk4GNpvZgu2xzJLm4r0nAekbi2I03_x71hbM2Y7xNflmG2bKUYU7hCvKbNcdqE_SqMiZ
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB5RUFU4AOUhlkfrA1Klqlmc2ImdI49Fy2Ph0C3iFiXOBFawu2hJLvx6xk52RUsPXKIcbMny2DPfeL6ZAdjneRQRUs69wNAll2Hse6nKCq9AFWYCU_TRsXyvou4feX4b3s7Br1kuDCI68hm27a-L5edjU9mnsgMCM1KJ-BMshFLKsM7WmsUMbLPsmmHIPfKkdRPD9Hl80D_pnJEvGARtQXgmCORfVsi1VXmni52BOV2B3nRpNa_koV2VWdu8_FO18aNrX4XlBmmyw_pofIU5HK3B0pv6g2vw2fE_zfM63FyT6hg2OZlsXLCOa48zMOy3SyZhgxFL2U1qqmrI3CvipHqiL3OUA2aD9qQzf7CjwR3rscPHu_FkUN4PN6B_2ukfd72m5YJnAhmWnshUjNLXXCnCcibXkhxAU_BY80zZUmlCG4U6xUIXoYiwwNTPFVdIosU0EpswPxqPcAsYDSDwR3gUYyEJ1WS5T_ZY-mnAdSZk3IKfUwkkT3VhjcQ5JDxOrLgSK66kEVcL1u2OzgY2m9mC3anMkubqPScBaRyLYzTf_v-s7_Cl2-9dJpdnVxc7sGj7x9dUnF2YLycV7hHKKLNv7nC9AoIDy-Y
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Optimization+of+Electric+Stress+in+a+Vacuum+Interrupter+Using+Charnes%E2%80%99+Big+M+Algorithm&rft.jtitle=IEEE+transactions+on+dielectrics+and+electrical+insulation&rft.au=Dasgupta%2C+Suryendu&rft.au=Baral%2C+Arijit&rft.au=Lahiri%2C+Abhijit&rft.date=2023-04-01&rft.issn=1070-9878&rft.eissn=1558-4135&rft.volume=30&rft.issue=2&rft.spage=877&rft.epage=882&rft_id=info:doi/10.1109%2FTDEI.2022.3231224&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TDEI_2022_3231224
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1070-9878&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1070-9878&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1070-9878&client=summon