APA (7th ed.) Citation

Tam, J. M. y., Wong, H., Han, Y., Jin, G., & Chow, H. (2025). Measurement of complex surfaces using precision coordinate measuring machine with Zernike algorithms. Measurement science & technology, 36(6), 65009. https://doi.org/10.1088/1361-6501/add7fa

Chicago Style (17th ed.) Citation

Tam, Juliana Mei yuk, Henry Wong, Yixiao Han, Gang Jin, and Hester Chow. "Measurement of Complex Surfaces Using Precision Coordinate Measuring Machine with Zernike Algorithms." Measurement Science & Technology 36, no. 6 (2025): 65009. https://doi.org/10.1088/1361-6501/add7fa.

MLA (9th ed.) Citation

Tam, Juliana Mei yuk, et al. "Measurement of Complex Surfaces Using Precision Coordinate Measuring Machine with Zernike Algorithms." Measurement Science & Technology, vol. 36, no. 6, 2025, p. 65009, https://doi.org/10.1088/1361-6501/add7fa.