Mean based relief: An improved feature selection method based on ReliefF - Aggarwal, Nitisha; Shukla, Unmesh; Saxena, Geetika Jain; Rawat, Mukesh; Bafila, Anil Singh; Singh, Sanjeev; Pundir, Amit (Applied intelligence (Dordrecht, Netherlands), 2023)
Keywords: Algorithms; Artificial Intelligence; Chi-square test; Classification; Cognitive tasks; Computer Science; Datasets; Estimates; Feature selection; Machine learning; Machines; Manufacturing; Mechanical Engineering; Processes; Synthetic data; Feature selection; ReliefF; Machine learning; Filter method