A Highly Stable Physically Unclonable Function Using Algorithm-Based Mismatch Hardening Technique in 28-nm CMOS - Yang, Shao-Hong; Liu, Tsung-Te (IEEE transactions on circuits and systems. I, Regular papers, 2023)
Keywords: Algorithms; Bit error rate; CMOS; Entropy; Error correction codes; Hardening; hardware security; Internet of Things; Internet of Things (IoT); key storage; Physical unclonable function; Physically unclonable function (PUF); process variation; Reliability; Security; Stability analysis; Stabilization; weak puf