APA (7th ed.) Citation

Yang, S., & Liu, T. (2023). A Highly Stable Physically Unclonable Function Using Algorithm-Based Mismatch Hardening Technique in 28-nm CMOS. IEEE transactions on circuits and systems. I, Regular papers, 70(1), 280-289. https://doi.org/10.1109/TCSI.2022.3217992

Chicago Style (17th ed.) Citation

Yang, Shao-Hong, and Tsung-Te Liu. "A Highly Stable Physically Unclonable Function Using Algorithm-Based Mismatch Hardening Technique in 28-nm CMOS." IEEE Transactions on Circuits and Systems. I, Regular Papers 70, no. 1 (2023): 280-289. https://doi.org/10.1109/TCSI.2022.3217992.

MLA (9th ed.) Citation

Yang, Shao-Hong, and Tsung-Te Liu. "A Highly Stable Physically Unclonable Function Using Algorithm-Based Mismatch Hardening Technique in 28-nm CMOS." IEEE Transactions on Circuits and Systems. I, Regular Papers, vol. 70, no. 1, 2023, pp. 280-289, https://doi.org/10.1109/TCSI.2022.3217992.