Area Minimization Synthesis for Reconfigurable Single-Electron Transistor Arrays with Fabrication Constraints
Power dissipation has become a pressing issue of concern in the designs of most electronic system as fabrication processes enter even deeper submicron regions. More specifically, leakage power plays a dominant role in system power dissipation. An emerging circuit design style, the reconfigurable sin...
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| Published in | ACM journal on emerging technologies in computing systems Vol. 12; no. 4; pp. 1 - 15 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
| Published |
01.07.2016
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1550-4832 1550-4840 |
| DOI | 10.1145/2906360 |
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| Abstract | Power dissipation has become a pressing issue of concern in the designs of most electronic system as fabrication processes enter even deeper submicron regions. More specifically, leakage power plays a dominant role in system power dissipation. An emerging circuit design style, the reconfigurable single-electron transistor (SET) array, has been proposed for continuing Moore's Law due to its ultra-low leakage power consumption. Recently, several works have been proposed to address the issues related to automated synthesis for the reconfigurable SET array. Nevertheless, all of those existing approaches consider mandatory fabrication constraints of SET array merely in late synthesis stages. In this article, we propose a synthesis algorithm, featuring input-variable ordering and dynamic product term ordering, for area minimization. The fabrication constraints are taken into account at every synthesis stage of proposed flow to guarantee better synthesis outcomes. We also develop a simulated annealing-based postprocess to find a proper phase assignment of each input variable for further area reduction. Experimental results show that our new methodology can achieve up to 29% area reduction as compared to existing state-of-the-art techniques. |
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| AbstractList | Power dissipation has become a pressing issue of concern in the designs of most electronic system as fabrication processes enter even deeper submicron regions. More specifically, leakage power plays a dominant role in system power dissipation. An emerging circuit design style, the reconfigurable single-electron transistor (SET) array, has been proposed for continuing Moore's Law due to its ultra-low leakage power consumption. Recently, several works have been proposed to address the issues related to automated synthesis for the reconfigurable SET array. Nevertheless, all of those existing approaches consider mandatory fabrication constraints of SET array merely in late synthesis stages. In this article, we propose a synthesis algorithm, featuring input-variable ordering and dynamic product term ordering, for area minimization. The fabrication constraints are taken into account at every synthesis stage of proposed flow to guarantee better synthesis outcomes. We also develop a simulated annealing-based postprocess to find a proper phase assignment of each input variable for further area reduction. Experimental results show that our new methodology can achieve up to 29% area reduction as compared to existing state-of-the-art techniques. |
| Author | Chen, Jian-Yu Chen, Yi-Hang Huang, Juinn-Dar |
| Author_xml | – sequence: 1 givenname: Yi-Hang surname: Chen fullname: Chen, Yi-Hang organization: National Chiao Tung University, Hsinchu City, Taiwan – sequence: 2 givenname: Jian-Yu surname: Chen fullname: Chen, Jian-Yu organization: National Chiao Tung University, Hsinchu City, Taiwan – sequence: 3 givenname: Juinn-Dar surname: Huang fullname: Huang, Juinn-Dar organization: National Chiao Tung University, Hsinchu City, Taiwan |
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| Cites_doi | 10.1109/TC.1986.1676819 10.1126/science.1061797 10.1063/1.2761837 10.1109/LED.2002.801291 10.1063/1.121014 10.1145/2422094.2422099 10.1109/16.310117 10.1016/S1386-9477(01)00193-X 10.1109/NANOARCH.2008.4585793 10.1063/1.1569994 10.1109/TED.2015.2395252 10.1145/2024724.2024920 10.1109/16.595938 |
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| References | Chiang C. E. (e_1_2_1_6_1) e_1_2_1_7_1 e_1_2_1_8_1 e_1_2_1_5_1 Chen Y. H. (e_1_2_1_3_1) Kasai S. (e_1_2_1_11_1) e_1_2_1_4_1 e_1_2_1_1_1 e_1_2_1_10_1 Liu C. W. (e_1_2_1_13_1) e_1_2_1_21_1 e_1_2_1_2_1 Kasai S. (e_1_2_1_12_1) Liu L. (e_1_2_1_15_1) e_1_2_1_22_1 e_1_2_1_16_1 e_1_2_1_17_1 Somenzi F. (e_1_2_1_18_1) 2009 e_1_2_1_14_1 Uchida K. (e_1_2_1_20_1) e_1_2_1_9_1 e_1_2_1_19_1 |
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| SubjectTerms | Arrays Circuit design Leakage Order disorder Power dissipation Reduction Single-electron transistors Synthesis |
| Title | Area Minimization Synthesis for Reconfigurable Single-Electron Transistor Arrays with Fabrication Constraints |
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