Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis

Software plays an integral part in our lives today because of its near-ubiquitous influence on our increasingly technological society. Taking appropriate steps to improve software quality is of paramount importance. This has fueled a surge of techniques in program testing and analysis. Unfortunately...

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Published inIEEE transactions on reliability Vol. 70; no. 2; pp. 443 - 445
Main Authors Tse, T. H., Traon, Yves Le, Chen, Zhenyu
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN0018-9529
1558-1721
1558-1721
DOI10.1109/TR.2021.3083375

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Abstract Software plays an integral part in our lives today because of its near-ubiquitous influence on our increasingly technological society. Taking appropriate steps to improve software quality is of paramount importance. This has fueled a surge of techniques in program testing and analysis. Unfortunately, these techniques still suffer from immaturity and impracticality, which have hindered truthful benefits to the software industry. The Special Sections on Software Testing and Program Analysis solicited original work that would provide novel techniques and/or comprehensive empirical validation applicable to real-world software. We successfully attracted more than 70 submissions covering diverse hot topics. After rigorous evaluations by hard-working reviewers, possibly with recommendations for major and minor revisions, we have published 26 articles in five issues of the IEEE Transactions on Reliability in June, September, and December 2018, January 2019, and June 2021. The articles represent a comprehensive cross section of testing and analysis techniques, as well as a wide variety of applications to practical projects. The present retrospective provides readers with interesting details about our great success and a small challenge.
AbstractList Software plays an integral part in our lives today because of its near-ubiquitous influence on our increasingly technological society. Taking appropriate steps to improve software quality is of paramount importance. This has fueled a surge of techniques in program testing and analysis. Unfortunately, these techniques still suffer from immaturity and impracticality, which have hindered truthful benefits to the software industry. The Special Sections on Software Testing and Program Analysis solicited original work that would provide novel techniques and/or comprehensive empirical validation applicable to real-world software. We successfully attracted more than 70 submissions covering diverse hot topics. After rigorous evaluations by hard-working reviewers, possibly with recommendations for major and minor revisions, we have published 26 articles in five issues of the IEEE Transactions on Reliability in June, September, and December 2018, January 2019, and June 2021. The articles represent a comprehensive cross section of testing and analysis techniques, as well as a wide variety of applications to practical projects. The present retrospective provides readers with interesting details about our great success and a small challenge.
The papers in this special section focus on software testing and program analysis. Software plays an integral part in our lives today because of its near-ubiquitous influence on our increasingly technological society. Taking appropriate steps to improve software quality is, therefore, of paramount importance. This has fueled the demand for techniques in software testing and program analysis. To meet the demand, there has been a surge in the study and development of techniques such as test case generation, static and dynamic program analysis, and test case prioritization. However, these techniques are still suffering from immaturity and impracticality. Test case generation can hardly be automated; efficiency and state-explosion are still the biggest concerns for most program analysis; and the effectiveness of test case prioritization is still based on small empirical comparisons. Furthermore, the vast majority of empirical studies available on the subject are lab based. Researchers typically evaluate their techniques based on simplified assumptions and selected subject programs that do not necessarily reflect the complexity of large-scale, industrial software. These shortcomings have prevented contemporary software testing and program analysis techniques from yielding truthful benefits to the software in the real world.
Author Chen, Zhenyu
Tse, T. H.
Traon, Yves Le
Author_xml – sequence: 1
  givenname: T. H.
  orcidid: 0000-0002-0460-8377
  surname: Tse
  fullname: Tse, T. H.
  email: thtse@cs.hku.hk
  organization: Department of Computer Science, The University of Hong Kong, Pokfulam, Hong Kong
– sequence: 2
  givenname: Yves Le
  surname: Traon
  fullname: Traon, Yves Le
  email: yves.letraon@uni.lu
  organization: Interdisciplinary Centre for Security, Reliability and Trust, University of Luxembourg, Esch-sur-Alzette, Luxembourg
– sequence: 3
  givenname: Zhenyu
  orcidid: 0000-0002-9592-7022
  surname: Chen
  fullname: Chen, Zhenyu
  email: zychen@nju.edu.cn
  organization: State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, China
BookMark eNplkM1rwjAYxsNwMHU777BLYOdqPjXZTcS5gbCh3XGU2CZSqUmX1In__VIqO2yn9-t5Hl5-A9CzzmoA7jEaYYzkOF2PCCJ4RJGgdMqvQB9zLhI8JbgH-ghhkUhO5A0YhLCPI2NS9MHn8qhDAxdF2ThfquoJzuBaN96FWudN-a2hM3AT-3iDm3blbIDOwo0zzUl5DdPoL-0OKlvAd-92Xh3gzKrqHMpwC66NqoK-u9Qh-HhepPOXZPW2fJ3PVklOMGsSagzSXCnEjEKIiaIQhTEEFZhOtpQX-VbmWkuWx0kjxqeISYO2nChqJqxgdAhQl3u0tTqfVFVltS8Pyp8zjLIWT9b4rMWTXfBEy2Nnqb37ahlke3f08e-QEU4l5XgicFSNO1UeiQSvzb_cdP0396FzlFrrX7VkTBAh6A92DH6a
CODEN IERQAD
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
ADTOC
UNPAY
DOI 10.1109/TR.2021.3083375
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Unpaywall for CDI: Periodical Content
Unpaywall
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
– sequence: 2
  dbid: UNPAY
  name: Unpaywall
  url: https://proxy.k.utb.cz/login?url=https://unpaywall.org/
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-1721
EndPage 445
ExternalDocumentID 10.1109/tr.2021.3083375
10_1109_TR_2021_3083375
9448288
Genre opinion
Commentary
Editorial
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
8WZ
97E
A6W
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
OCL
P2P
RIA
RIE
RNS
TN5
VH1
VJK
AAYXX
CITATION
7SP
8FD
L7M
ADTOC
UNPAY
ID FETCH-LOGICAL-c214t-3ff0e5aa04fa0048dd8dff20d136b35dcb9cee94c6b3e0457049f0b52a3f64d43
IEDL.DBID RIE
ISSN 0018-9529
1558-1721
IngestDate Tue Aug 19 19:16:08 EDT 2025
Mon Jun 30 10:26:36 EDT 2025
Wed Oct 01 01:27:38 EDT 2025
Wed Aug 27 02:26:24 EDT 2025
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 2
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c214t-3ff0e5aa04fa0048dd8dff20d136b35dcb9cee94c6b3e0457049f0b52a3f64d43
Notes SourceType-Scholarly Journals-1
content type line 14
ObjectType-Editorial-2
ObjectType-Commentary-1
ORCID 0000-0002-0460-8377
0000-0002-9592-7022
OpenAccessLink https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ielx7/24/9448244/09448288.pdf
PQID 2539351681
PQPubID 85456
PageCount 3
ParticipantIDs crossref_primary_10_1109_TR_2021_3083375
unpaywall_primary_10_1109_tr_2021_3083375
proquest_journals_2539351681
ieee_primary_9448288
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2021-June
2021-6-00
20210601
PublicationDateYYYYMMDD 2021-06-01
PublicationDate_xml – month: 06
  year: 2021
  text: 2021-June
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on reliability
PublicationTitleAbbrev TR
PublicationYear 2021
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
SSID ssj0014498
Score 2.3015609
Snippet Software plays an integral part in our lives today because of its near-ubiquitous influence on our increasingly technological society. Taking appropriate steps...
The papers in this special section focus on software testing and program analysis. Software plays an integral part in our lives today because of its...
SourceID unpaywall
proquest
crossref
ieee
SourceType Open Access Repository
Aggregation Database
Index Database
Publisher
StartPage 443
SubjectTerms Demand analysis
Empirical analysis
Program verification (computers)
Software quality
Software reliability
Software systems
Software testing
Special issues and sections
Workflow management software
SummonAdditionalLinks – databaseName: Unpaywall
  dbid: UNPAY
  link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3LSyMxGP9w62HZg2-x4i45eNDDTJNJMs14K9IqgiLagivIkEwSEcu01Ck-_nqTeUjV0-4tgUAy-eV7Tb78PoB9rRMmsFYBIcYEzEqnB6VRAe5mWFpitDH-h_75RXw6Ymc3_Gah1JevcFImn5nQN8u7_Aczful2ItZJXCzhzFEHlw0hwqm2P2A59ndLLVgeXVz2_laa1wkxLyuUOXPpoiQX5tS0PgQnncLzgEYkpM79oD7BcMEilSVWPnmbP-f5VL4-y_F4wfAMVuG2WXKVb_IYzgsVZm9f2Bz_65vWYKV2R1GvOj_rsGTyDfi1QFK4CXcnfoWorx88n4gcH6EeujLFbNI80kQTi-oy9ui6zOzKn9AkR9dOwz_LmUFDz-SR3yOZa3RZ5YOhhgxlC0aD_vD4NKiLMgRZRFgRUGux4VJih6sXf62FtjbCmtBYUa4zlTi7m7DM9YzzF7suBLFY8UhSGzPN6Da08kludgBxqWWmLDWUS8apFEJpwSLLFdMq6oo2HDTApNOKeyMtYxacpMOr1GOY1hi2YdNv7cewejPbsNcAmday-ZRG3D9HJrEgbTj8APfbDMXs0wy7_zB2D1rFbG5-O3elUH_qg_kO09jmiQ
  priority: 102
  providerName: Unpaywall
Title Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis
URI https://ieeexplore.ieee.org/document/9448288
https://www.proquest.com/docview/2539351681
https://ieeexplore.ieee.org/ielx7/24/9448244/09448288.pdf
UnpaywallVersion publishedVersion
Volume 70
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-1721
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014498
  issn: 0018-9529
  databaseCode: RIE
  dateStart: 19630101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NaxQxFH-09aA9WLUWV2vJwYOCs83nzsTbUlqL0FK2u1APMiSTl1JcZsp2llL_epP5WLbqwdsEAi-Tl_eVvPd7AB-c0zKjziaMISbSm6AHDdqEpgU1nqFDjBf6Z-ej05n8dqWuNuDzqhYGEZvkMxzGz-Yt31XFMl6VHeoQS_As24TNNNVtrdbqxUBK3WndIMCK6w7Gh1F9OJ2EOJCzoQjuhogJhWsWqGmp8si7fLosb83DvZnP1wzNyQ6c9Uts80t-Dpe1HRa__kBv_N9_eAHPO4-TjNsj8hI2sHwF22s4hLvw42tcFDl2NxEyxMy_kDGZYL2o-jpMUnnSdaonl03yVnlHqpJcBiV-bxZIphGso7wmpnTkok35Ij3eyWuYnRxPj06Tru9CUnAm60R4T1EZQwProoQ7lznvOXVMjKxQrrA6mFYtizDC4BKmIcrw1CpuhB9JJ8UebJVViW-AKONMYb1AoYxUwmSZdZnkXlnpLE-zAXzseZHftvAaeROWUJ1PJ3lkW96xbQC7cTdX07qNHMB-z7u8E7-7nKtYccxGGRvApxU__6JQLx5RePtvCu_gWZzV5oftw1a9WOL74InU9qA5ggfwZHZ-Mf7-G-x_3dE
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB6VcigcKFAqFlrwgQNIZOvnrsOtqloW6FZom0q9oMiOxwixSqptVhX8euw8VtvCgZsjJRrH43nZM98AvHEulZo6mzCGmEhvgh40aBM6LqjxDB1iPNCfno0mF_LzpbrcgPerWhhEbJLPcBiHzV2-q4plPCo7SEMswbW-B_dVGI3baq3VnYGUaad3gwgrnnZAPoymB9ksRIKcDUVwOERMKVyzQU1TlVv-5dayvDK_bsx8vmZqTrZh2k-yzTD5OVzWdlj8voPf-L9_8RgedT4nOWw3yRPYwPIpPFxDItyBbx_jpMix-xFBQ8z8AzkkM6wXVV-JSSpPul715LxJ3yqvSVWS86DGb8wCSRbhOsrvxJSOfG2TvkiPePIMLk6Os6NJ0nVeSArOZJ0I7ykqY2hgXpRx57TznlPHxMgK5QqbBuOayiI8YXAKxyHO8NQqboQfSSfFLmyWVYnPgSjjTGG9QKGMVMJobZ2W3CsrneVjPYC3PS_yqxZgI28CE5rm2SyPbMs7tg1gJ67m6rVuIQew1_Mu7wTwOucq1hyzkWYDeLfi518U6sUtCi_-TeE1bE2y6Wl--unsy0t4EL9os8X2YLNeLHE_-CW1fdVsxz--md9y
linkToUnpaywall http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3LSyMxGP9w62HZg2-x4i45eNDDTJNJMs14K9IqgiLagivIkEwSEcu01Ck-_nqTeUjV0-4tgUAy-eV7Tb78PoB9rRMmsFYBIcYEzEqnB6VRAe5mWFpitDH-h_75RXw6Ymc3_Gah1JevcFImn5nQN8u7_Aczful2ItZJXCzhzFEHlw0hwqm2P2A59ndLLVgeXVz2_laa1wkxLyuUOXPpoiQX5tS0PgQnncLzgEYkpM79oD7BcMEilSVWPnmbP-f5VL4-y_F4wfAMVuG2WXKVb_IYzgsVZm9f2Bz_65vWYKV2R1GvOj_rsGTyDfi1QFK4CXcnfoWorx88n4gcH6EeujLFbNI80kQTi-oy9ui6zOzKn9AkR9dOwz_LmUFDz-SR3yOZa3RZ5YOhhgxlC0aD_vD4NKiLMgRZRFgRUGux4VJih6sXf62FtjbCmtBYUa4zlTi7m7DM9YzzF7suBLFY8UhSGzPN6Da08kludgBxqWWmLDWUS8apFEJpwSLLFdMq6oo2HDTApNOKeyMtYxacpMOr1GOY1hi2YdNv7cewejPbsNcAmday-ZRG3D9HJrEgbTj8APfbDMXs0wy7_zB2D1rFbG5-O3elUH_qg_kO09jmiQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Guest+Editorial%3A+A+Retrospective+of+Special+Sections+on+Software+Testing+and+Program+Analysis&rft.jtitle=IEEE+transactions+on+reliability&rft.au=Tse%2C+T.+H.&rft.au=Traon%2C+Yves+Le&rft.au=Chen%2C+Zhenyu&rft.date=2021-06-01&rft.pub=IEEE&rft.issn=0018-9529&rft.volume=70&rft.issue=2&rft.spage=443&rft.epage=445&rft_id=info:doi/10.1109%2FTR.2021.3083375&rft.externalDocID=9448288
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9529&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9529&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9529&client=summon