APA (7th ed.) Citation

Tse, T. H., Traon, Y. L., & Chen, Z. (2021). Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis. IEEE transactions on reliability, 70(2), 443-445. https://doi.org/10.1109/TR.2021.3083375

Chicago Style (17th ed.) Citation

Tse, T. H., Yves Le Traon, and Zhenyu Chen. "Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis." IEEE Transactions on Reliability 70, no. 2 (2021): 443-445. https://doi.org/10.1109/TR.2021.3083375.

MLA (9th ed.) Citation

Tse, T. H., et al. "Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis." IEEE Transactions on Reliability, vol. 70, no. 2, 2021, pp. 443-445, https://doi.org/10.1109/TR.2021.3083375.