How to Evaluate Deep Neural Network Processors: TOPS/W (Alone) Considered Harmful - Sze, Vivienne; Chen, Yu-Hsin; Yang, Tien-Ju; Emer, Joel S. (IEEE solid state circuits magazine, 2020)
Keywords: Artificial neural networks; Deep learning; Integrated circiut modeling; Machine learning; Neural networks; Performance evaluation; Processors; Program processors; Scalability