Liu, L., Wen, Q., Li, Y., Fu, D., & Cai, X. (2025, August 26). Stubborn State Observers for Incrementally Quadratic Descriptor Systems Subject to Measurement Outliers. Circuits, systems, and signal processing. https://doi.org/10.1007/s00034-025-03285-5
Chicago Style (17th ed.) CitationLiu, Leipo, Qiaofeng Wen, Yanan Li, Dexin Fu, and Xiushan Cai. "Stubborn State Observers for Incrementally Quadratic Descriptor Systems Subject to Measurement Outliers." Circuits, Systems, and Signal Processing 26 Aug. 2025. https://doi.org/10.1007/s00034-025-03285-5.
MLA (9th ed.) CitationLiu, Leipo, et al. "Stubborn State Observers for Incrementally Quadratic Descriptor Systems Subject to Measurement Outliers." Circuits, Systems, and Signal Processing, 26 Aug. 2025, https://doi.org/10.1007/s00034-025-03285-5.