Optimal designs of (k,n-k+1)-out-of-n:F systems (subject to 2 failure modes) - Pham, H.; Pham, M. (IEEE transactions on reliability, 1991)
Keywords: Applied sciences; Circuits; Costs; Design engineering; Design optimization; Diodes; Exact sciences and technology; Failure analysis; Laboratories; Operational research and scientific management; Operational research. Management science; Reliability engineering; Reliability theory; Reliability theory. Replacement problems; Resistors; K out of n system; Breakdown; Profit; System reliability; Reliability; Optimal design