Characterization of Ge Doping on Sb2Te3 for High-Speed Phase Change Memory Application
Tile phase change material of Ge-doped Sb2 Te3 is shown to have higher crystallization temperature and better thermal stability compared with pure Sb2Te3. Ge0.11Sb2Te3 alloys are considered to be a potential candidate for phase change random access memories, as proved by a higher crystallization tem...
Saved in:
| Published in | 中国物理快报:英文版 no. 7; pp. 168 - 170 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
01.07.2015
|
| Subjects | |
| Online Access | Get full text |
| ISSN | 0256-307X 1741-3540 |
| DOI | 10.1088/0256-307X/32/7/077302 |
Cover
| Abstract | Tile phase change material of Ge-doped Sb2 Te3 is shown to have higher crystallization temperature and better thermal stability compared with pure Sb2Te3. Ge0.11Sb2Te3 alloys are considered to be a potential candidate for phase change random access memories, as proved by a higher crystallization temperature, a better data retention ability, and a faster switching speed in comparison with those of Ge2Sb2 Tes. In addition, Ge0.11Sb2 Te3 presents extremely rapid reverse switching speed (lOns), and up to 105 programming cycles are obtained with stable set and reset resistances. |
|---|---|
| AbstractList | Tile phase change material of Ge-doped Sb2 Te3 is shown to have higher crystallization temperature and better thermal stability compared with pure Sb2Te3. Ge0.11Sb2Te3 alloys are considered to be a potential candidate for phase change random access memories, as proved by a higher crystallization temperature, a better data retention ability, and a faster switching speed in comparison with those of Ge2Sb2 Tes. In addition, Ge0.11Sb2 Te3 presents extremely rapid reverse switching speed (lOns), and up to 105 programming cycles are obtained with stable set and reset resistances. |
| Author | 朱月琴 张中华 宋三年 谢华清 宋志棠 沈兰兰 李乐 吴良才 刘波 |
| AuthorAffiliation | School of Environmental and Materials Engineering, Shanghai Second Polytechnic University, Shanghai 201209 State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences, Shanghai 200050 |
| Author_xml | – sequence: 1 fullname: 朱月琴 张中华 宋三年 谢华清 宋志棠 沈兰兰 李乐 吴良才 刘波 |
| BookMark | eNo9jk1Lw0AURQepYFr9CcLgPmbevCQzsyxRW6Gi0CruymTy8iFtJibZ1F9vUHF1uXDP4c7ZrPUtMXYN4haE1pGQSRqiUO8RykhFQikU8owFoGIIMYnFjAX_mws2H4YPIQA0QMDestr21o3UN192bHzLfclXxO9817QVn_o2lztCXvqer5uqDrcdUcFfajsQn-C2Iv5ER9-f-LLrDo37sVyy89IeBrr6ywV7fbjfZetw87x6zJab0IGWY5jkTktTpGkiQYEhjHMojNECgRJFcakTI5C0tco5TAUW6HJrIS2oNDEaXLCbX6-rfVt9Tpf3Xd8cbX_aT1KdKpQavwF7JVPZ |
| ContentType | Journal Article |
| DBID | 2RA 92L CQIGP ~WA |
| DOI | 10.1088/0256-307X/32/7/077302 |
| DatabaseName | 中文期刊服务平台 中文科技期刊数据库-CALIS站点 维普中文期刊数据库 中文科技期刊数据库- 镜像站点 |
| DatabaseTitleList | |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Physics |
| DocumentTitleAlternate | Characterization of Ge Doping on Sb2Te3 for High-Speed Phase Change Memory Application |
| EISSN | 1741-3540 |
| EndPage | 170 |
| ExternalDocumentID | 665867328 |
| GroupedDBID | 02O 042 1JI 1PV 1WK 29B 2RA 4.4 5B3 5GY 5VR 5VS 5ZH 7.M 7.Q 92L AAGCD AAJIO AAJKP AALHV AATNI ABHWH ABJNI ABQJV ACAFW ACGFS ACHIP AEFHF AENEX AFUIB AFYNE AHSEE AKPSB ALMA_UNASSIGNED_HOLDINGS ASPBG ATQHT AVWKF AZFZN BBWZM CEBXE CJUJL CQIGP CRLBU CS3 EBS EDWGO EJD EMSAF EPQRW EQZZN FEDTE HAK HVGLF IHE IJHAN IOP IZVLO JCGBZ KNG KOT LAP M45 N5L N9A NS0 NT- NT. P2P PJBAE Q02 R4D RIN RNS RO9 ROL RPA RW3 S3P SY9 T37 UCJ W28 XPP ~02 ~WA |
| ID | FETCH-LOGICAL-c182t-5bc829d66521719e34b1d998031e57e4f85903e8aa7cc3603d3cbaa16def94393 |
| ISSN | 0256-307X |
| IngestDate | Wed Feb 14 10:29:00 EST 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 7 |
| Language | English |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-c182t-5bc829d66521719e34b1d998031e57e4f85903e8aa7cc3603d3cbaa16def94393 |
| Notes | 11-1959/O4 Tile phase change material of Ge-doped Sb2 Te3 is shown to have higher crystallization temperature and better thermal stability compared with pure Sb2Te3. Ge0.11Sb2Te3 alloys are considered to be a potential candidate for phase change random access memories, as proved by a higher crystallization temperature, a better data retention ability, and a faster switching speed in comparison with those of Ge2Sb2 Tes. In addition, Ge0.11Sb2 Te3 presents extremely rapid reverse switching speed (lOns), and up to 105 programming cycles are obtained with stable set and reset resistances. ZHU Yue-Qin, ZHANG Zhong-Hua, SONG San-Nian, XIE Hua-Qing, SONG Zhi-Tang, SHEN Lan-Lan, LI Le, WU Liang-Cai, LIU Bo ( 1School of Environmental and Materials Engineering, Shanghai Second Polytechnic University, Shanghai 201209 2State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences, Shanghai 200050) |
| PageCount | 3 |
| ParticipantIDs | chongqing_primary_665867328 |
| PublicationCentury | 2000 |
| PublicationDate | 2015-07-01 |
| PublicationDateYYYYMMDD | 2015-07-01 |
| PublicationDate_xml | – month: 07 year: 2015 text: 2015-07-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationTitle | 中国物理快报:英文版 |
| PublicationTitleAlternate | Chinese Physics Letters |
| PublicationYear | 2015 |
| SSID | ssj0011811 |
| Score | 2.092861 |
| Snippet | Tile phase change material of Ge-doped Sb2 Te3 is shown to have higher crystallization temperature and better thermal stability compared with pure Sb2Te3.... |
| SourceID | chongqing |
| SourceType | Publisher |
| StartPage | 168 |
| SubjectTerms | 化学表征 应用 掺杂 热稳定性 相变存储器 结晶温度 随机存取存储器 |
| Title | Characterization of Ge Doping on Sb2Te3 for High-Speed Phase Change Memory Application |
| URI | http://lib.cqvip.com/qk/84212X/201507/665867328.html |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIOP databaseName: Institute of Physics (IOP) Publishing Journals customDbUrl: eissn: 1741-3540 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0011811 issn: 0256-307X databaseCode: IOP dateStart: 19840101 isFulltext: true titleUrlDefault: https://iopscience.iop.org/ providerName: IOP Publishing |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3Nb9MwFLe2ISQuE5-CDZAP-FSFxnHs2EcnTTeQBpPoUG9T7Djs1A7oDuyv59lO0_AhBFwiN8_-2fF79fs5ebYRetVw1VhrRMJNxxKwEJo0ncgTwbkVWW65lH7t8Nk7cXqRv13y5d4-HUUt3WzMa3v723Ul_6NVuAd69atk_0GzAyjcgDToF66gYbj-lY6rYbfl24H5nTggxWERlB8JTLZwLIQS-oCO5MM1OKvJ-RW4rn5dweTMh9p-i2zU7tTU81VS56SURM9IzYkqSQmJgkhFtPIJlRIpvKicE12SWhCpieaknpOyIkqTWhIJpagXKZAWfXE5RNAGSbXNUoGkBy7zSUCuiE5_aIacEVkHma49epQBqM-tYjlJypTobMjuwX0mPi4Xmq0KL9MMapmEXFloApTjHmObCDIVoXJfjUoDVGhoeEzok3noAXi6WZABjpIBE9Cz8fsVyodY3O0wDKTQv6FbRo8Z3QTwsMS_MRv9Q4qRG6DxqKCeUdB4NMovzgoG-LCvR48PaeZ3w_Xf0NMCRt5s56OHyEkBjFH4DZb20Z0MHJk_reTN-_PhwxkQtnBI5BZ0u2hNyulwb8qyaTGNVfgtRa7Wq0-fwS5HxGpxHx32MyKso3k_QHtu9RDdDZHJ9usj9PFnI8frDp84HI0cw-9o5BiMHO-MHAcjx9HIcTRyPDLyx-hiXi-q06Q_DCSxMAXewFhiZaZaeH6YRFPlWG5oq5QEp-R44fJOcpUyJ5umsJaJlLXMmqahonWdAtbNnqCD1XrlniLcSUWlMy1lpoUJf2eApOVAFnNpFDVF-wwdD31yeR03fbkcOv7oj9JjdG9nRM_RwebLjXsBtHVjXgZFfQe_dmfH |
| linkProvider | IOP Publishing |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Characterization+of+Ge+Doping+on+Sb2Te3+for+High-Speed+Phase+Change+Memory+Application&rft.jtitle=%E4%B8%AD%E5%9B%BD%E7%89%A9%E7%90%86%E5%BF%AB%E6%8A%A5%EF%BC%9A%E8%8B%B1%E6%96%87%E7%89%88&rft.au=%E6%9C%B1%E6%9C%88%E7%90%B4+%E5%BC%A0%E4%B8%AD%E5%8D%8E+%E5%AE%8B%E4%B8%89%E5%B9%B4+%E8%B0%A2%E5%8D%8E%E6%B8%85+%E5%AE%8B%E5%BF%97%E6%A3%A0+%E6%B2%88%E5%85%B0%E5%85%B0+%E6%9D%8E%E4%B9%90+%E5%90%B4%E8%89%AF%E6%89%8D+%E5%88%98%E6%B3%A2&rft.date=2015-07-01&rft.issn=0256-307X&rft.eissn=1741-3540&rft.issue=7&rft.spage=168&rft.epage=170&rft_id=info:doi/10.1088%2F0256-307X%2F32%2F7%2F077302&rft.externalDocID=665867328 |
| thumbnail_s | http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fimage.cqvip.com%2Fvip1000%2Fqk%2F84212X%2F84212X.jpg |