Deep Learning and ECM Fusion for Realization of Advanced Resistive Ink FSS-Based Customized Microwave Absorber - Agrawal, Anjali; Kumar, Anil; Panwar, Ravi (IEEE journal on electromagnetic compatibility practice and applications, 2024)
Keywords: Absorption; Artificial neural networks; Current distribution; Customization; Deep learning; Deep neural network (DNN); Dielectric substrates; Electromagnetic compatibility; electromagnetic compatibility (EMC); equivalent circuit modeling; Equivalent circuits; Frequency selective surfaces; frequency-selective surface (FSS); Machine learning; microwave absorber; Microwave absorbers; Microwave circuits; Rectangular waveguides; Reflectance; Reflection coefficient; Resonant frequencies; Search algorithms; stealth technology; Superhigh frequencies; Wave reflection