Measurement- and Simulated Annealing (SA) Optimization-Based Inductor Model Coupled to Chassis - Park, Junyong; Vahdani, Reza; Kim, DongHyun (IEEE transactions on instrumentation and measurement, 2025)
Keywords: Algorithms; Chassis; Conducted emission (CE); Coupling; Couplings; Electric components; electromagnetic compatibility (EMC); Equivalence; Impedance; impedance analyzer (IA); Impedance measurement; Inductance; Inductance measurement; inductor modeling; Inductors; Integrated circuit modeling; linear regression; Metals; Network analysers; Optimization; Optimization algorithms; Power factor; Semiconductor device measurement; Simulated annealing; simulated annealing (SA); Transfer functions; vector network analyzer (VNA)