Measurement- and Simulated Annealing (SA) Optimization-Based Inductor Model Coupled to Chassis

In automotive systems, a metal chassis protects the components against the external environment. However, the metal chassis is conductive, which results in unwanted conducted emission (CE) coupling to electric components. An inductor used for power factor correction (PFC) is one of the affected comp...

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Published inIEEE transactions on instrumentation and measurement Vol. 74; pp. 1 - 11
Main Authors Park, Junyong, Vahdani, Reza, Kim, DongHyun
Format Journal Article
LanguageEnglish
Published New York IEEE 2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
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ISSN0018-9456
1557-9662
DOI10.1109/TIM.2025.3608334

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Abstract In automotive systems, a metal chassis protects the components against the external environment. However, the metal chassis is conductive, which results in unwanted conducted emission (CE) coupling to electric components. An inductor used for power factor correction (PFC) is one of the affected components. When the inductor is mated with the metal chassis, the impedance of the inductor changes. It is also hard to predict the CE coupling due to the structure-dependent characteristics. That is, the CE coupling is not negligible and hard to clarify. Therefore, this article proposes an efficient modeling method for the inductor, which is mated with the metal chassis. The proposed method includes the measurements and optimization algorithm. The measurement setups include an impedance analyzer (IA) and a vector network analyzer (VNA). The IA is used to measure the accurate inductance value of the inductor, and the VNA is used to measure the coupling to a chassis. The optimization algorithm includes simulated annealing (SA). The equivalent models for the inductor, the inductor with 2-D metal chassis, and the inductor with 3-D metal chassis are introduced, respectively. The introduced equivalent models are well-matched to the measurements up to 100 MHz.
AbstractList In automotive systems, a metal chassis protects the components against the external environment. However, the metal chassis is conductive, which results in unwanted conducted emission (CE) coupling to electric components. An inductor used for power factor correction (PFC) is one of the affected components. When the inductor is mated with the metal chassis, the impedance of the inductor changes. It is also hard to predict the CE coupling due to the structure-dependent characteristics. That is, the CE coupling is not negligible and hard to clarify. Therefore, this article proposes an efficient modeling method for the inductor, which is mated with the metal chassis. The proposed method includes the measurements and optimization algorithm. The measurement setups include an impedance analyzer (IA) and a vector network analyzer (VNA). The IA is used to measure the accurate inductance value of the inductor, and the VNA is used to measure the coupling to a chassis. The optimization algorithm includes simulated annealing (SA). The equivalent models for the inductor, the inductor with 2-D metal chassis, and the inductor with 3-D metal chassis are introduced, respectively. The introduced equivalent models are well-matched to the measurements up to 100 MHz.
Author Kim, DongHyun
Vahdani, Reza
Park, Junyong
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Cites_doi 10.1109/tie.2023.3239906
10.1109/tpel.2003.810856
10.1002/9780470290996
10.1109/tpel.2019.2929209
10.1109/tmtt.2011.2140126
10.1126/science.220.4598.671
10.1109/tmtt.2006.886157
10.1109/tie.2008.922768
10.1109/tpel.2006.872378
10.1109/i2mtc53148.2023.10176084
10.1109/15.8769
10.1142/6986
10.1109/pes.2005.1489532
10.1109/63.602562
10.1002/9780470561232
10.1109/tcst.2003.815606
10.1109/tpel.2013.2258472
10.1109/tie.2009.2025284
10.1109/tpel.2012.2197867
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References ref13
ref15
ref14
ref20
Anderson (ref19) 2023
ref11
ref10
ref21
ref2
ref1
ref17
ref16
ref18
ref8
ref7
ref9
ref4
ref3
ref6
ref5
(ref12) 2023
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  doi: 10.1109/tie.2023.3239906
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  doi: 10.1109/tpel.2003.810856
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  doi: 10.1002/9780470290996
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  doi: 10.1109/tpel.2019.2929209
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  doi: 10.1109/tmtt.2011.2140126
– ident: ref18
  doi: 10.1126/science.220.4598.671
– ident: ref9
  doi: 10.1109/tmtt.2006.886157
– ident: ref1
  doi: 10.1109/tie.2008.922768
– volume-title: Kelvin (4-Wire) Resistance Measurement: DC Metering Circuits: Electronics Textbook
  year: 2023
  ident: ref12
– volume-title: Simulated Annealing
  year: 2023
  ident: ref19
– ident: ref2
  doi: 10.1109/tpel.2006.872378
– ident: ref15
  doi: 10.1109/i2mtc53148.2023.10176084
– ident: ref16
  doi: 10.1109/15.8769
– ident: ref20
  doi: 10.1142/6986
– ident: ref11
  doi: 10.1109/pes.2005.1489532
– ident: ref8
  doi: 10.1109/63.602562
– ident: ref17
  doi: 10.1002/9780470561232
– ident: ref3
  doi: 10.1109/tcst.2003.815606
– ident: ref6
  doi: 10.1109/tpel.2013.2258472
– ident: ref4
  doi: 10.1109/tie.2009.2025284
– ident: ref5
  doi: 10.1109/tpel.2012.2197867
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SubjectTerms Algorithms
Chassis
Conducted emission (CE)
Coupling
Couplings
Electric components
electromagnetic compatibility (EMC)
Equivalence
Impedance
impedance analyzer (IA)
Impedance measurement
Inductance
Inductance measurement
inductor modeling
Inductors
Integrated circuit modeling
linear regression
Metals
Network analysers
Optimization
Optimization algorithms
Power factor
Semiconductor device measurement
Simulated annealing
simulated annealing (SA)
Transfer functions
vector network analyzer (VNA)
Title Measurement- and Simulated Annealing (SA) Optimization-Based Inductor Model Coupled to Chassis
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