Measurement- and Simulated Annealing (SA) Optimization-Based Inductor Model Coupled to Chassis
In automotive systems, a metal chassis protects the components against the external environment. However, the metal chassis is conductive, which results in unwanted conducted emission (CE) coupling to electric components. An inductor used for power factor correction (PFC) is one of the affected comp...
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          | Published in | IEEE transactions on instrumentation and measurement Vol. 74; pp. 1 - 11 | 
|---|---|
| Main Authors | , , | 
| Format | Journal Article | 
| Language | English | 
| Published | 
        New York
          IEEE
    
        2025
     The Institute of Electrical and Electronics Engineers, Inc. (IEEE)  | 
| Subjects | |
| Online Access | Get full text | 
| ISSN | 0018-9456 1557-9662  | 
| DOI | 10.1109/TIM.2025.3608334 | 
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| Abstract | In automotive systems, a metal chassis protects the components against the external environment. However, the metal chassis is conductive, which results in unwanted conducted emission (CE) coupling to electric components. An inductor used for power factor correction (PFC) is one of the affected components. When the inductor is mated with the metal chassis, the impedance of the inductor changes. It is also hard to predict the CE coupling due to the structure-dependent characteristics. That is, the CE coupling is not negligible and hard to clarify. Therefore, this article proposes an efficient modeling method for the inductor, which is mated with the metal chassis. The proposed method includes the measurements and optimization algorithm. The measurement setups include an impedance analyzer (IA) and a vector network analyzer (VNA). The IA is used to measure the accurate inductance value of the inductor, and the VNA is used to measure the coupling to a chassis. The optimization algorithm includes simulated annealing (SA). The equivalent models for the inductor, the inductor with 2-D metal chassis, and the inductor with 3-D metal chassis are introduced, respectively. The introduced equivalent models are well-matched to the measurements up to 100 MHz. | 
    
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| AbstractList | In automotive systems, a metal chassis protects the components against the external environment. However, the metal chassis is conductive, which results in unwanted conducted emission (CE) coupling to electric components. An inductor used for power factor correction (PFC) is one of the affected components. When the inductor is mated with the metal chassis, the impedance of the inductor changes. It is also hard to predict the CE coupling due to the structure-dependent characteristics. That is, the CE coupling is not negligible and hard to clarify. Therefore, this article proposes an efficient modeling method for the inductor, which is mated with the metal chassis. The proposed method includes the measurements and optimization algorithm. The measurement setups include an impedance analyzer (IA) and a vector network analyzer (VNA). The IA is used to measure the accurate inductance value of the inductor, and the VNA is used to measure the coupling to a chassis. The optimization algorithm includes simulated annealing (SA). The equivalent models for the inductor, the inductor with 2-D metal chassis, and the inductor with 3-D metal chassis are introduced, respectively. The introduced equivalent models are well-matched to the measurements up to 100 MHz. | 
    
| Author | Kim, DongHyun Vahdani, Reza Park, Junyong  | 
    
| Author_xml | – sequence: 1 givenname: Junyong orcidid: 0000-0002-5446-1799 surname: Park fullname: Park, Junyong email: jpark@khu.ac.kr organization: Department of Semiconductor Engineering, Kyung Hee University, Global Campus, Yongin, Gyeonggi, Republic of Korea – sequence: 2 givenname: Reza orcidid: 0000-0002-2506-3476 surname: Vahdani fullname: Vahdani, Reza organization: EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA – sequence: 3 givenname: DongHyun orcidid: 0000-0003-2738-9549 surname: Kim fullname: Kim, DongHyun email: dkim@mst.edu organization: EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA  | 
    
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| SubjectTerms | Algorithms Chassis Conducted emission (CE) Coupling Couplings Electric components electromagnetic compatibility (EMC) Equivalence Impedance impedance analyzer (IA) Impedance measurement Inductance Inductance measurement inductor modeling Inductors Integrated circuit modeling linear regression Metals Network analysers Optimization Optimization algorithms Power factor Semiconductor device measurement Simulated annealing simulated annealing (SA) Transfer functions vector network analyzer (VNA)  | 
    
| Title | Measurement- and Simulated Annealing (SA) Optimization-Based Inductor Model Coupled to Chassis | 
    
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