Cover Image, Volume 52, Issue 19

• Published in: Journal of polymer science. Part B, Polymer physics Vol. 52; no. 19; pp. iii - iv
• Format: Journal Article
• Language: English
• Published: Blackwell Publishing Ltd 01.10.2014
• ISSN: 0887-6266; 1099-0488; 1099-0488
• DOI: 10.1002/polb.23579

The optimal morphology of P3HT/PCBM bulk heterojunction layers used for organic photovoltaic devices is the subject of intense debate. The study on page 1291 (DOI: 10.1002/polb.23564) by John D. Roehling, Christopher W. Rochester, Hyun Wook Ro, Peng Wang, Jaroslaw Majewski, K. Joost Batenburg, Ilke Arslan, Dean M. Delongchamp, and Adam J. Moulé compares three quantitative techniques to measure the materials distribution for samples processed under realistic conditions. Electron tomography provides maximal lateral contrast while neutron reflectometry, X‐ray reflectometry, and electron tomography all demonstrate vertical materials contrast. All three techniques are shown to have quantitative differences, highlighting the care that must be taken when interpreting measurements from only a single technique.