APA (7th ed.) Citation

Hosoki, S., & Hosaka, S. (1990). Surface observation and analysis of Si using an STM. HYBRIDS, 6(3), 3-10. https://doi.org/10.5104/jiep1985.6.3_3

Chicago Style (17th ed.) Citation

Hosoki, Shigeyuki, and Sumio Hosaka. "Surface Observation and Analysis of Si Using an STM." HYBRIDS 6, no. 3 (1990): 3-10. https://doi.org/10.5104/jiep1985.6.3_3.

MLA (9th ed.) Citation

Hosoki, Shigeyuki, and Sumio Hosaka. "Surface Observation and Analysis of Si Using an STM." HYBRIDS, vol. 6, no. 3, 1990, pp. 3-10, https://doi.org/10.5104/jiep1985.6.3_3.