5‐2: Tracing‐Based Degradation Estimation Method for Stress‐Profile Algorithm - Hong, Seokah; Goh, Joonchul; Bae, Jaesung; Kwag, Dongjoon; Kim, Hyeongjin; Choe, Wonjun (SID International Symposium Digest of technical papers, 2022)
Keywords: Algorithms; Compensation; Degradation; Display devices; Error compensation; Estimation; Image quality; Material properties; NED; Organic light emitting diodes; Stress Profiler; Tracing