APA (7th ed.) Citation

Hong, S., Goh, J., Bae, J., Kwag, D., Kim, H., & Choe, W. (2022). 5‐2: Tracing‐Based Degradation Estimation Method for Stress‐Profile Algorithm. SID International Symposium Digest of technical papers, 53(1), 28-31. https://doi.org/10.1002/sdtp.15407

Chicago Style (17th ed.) Citation

Hong, Seokah, Joonchul Goh, Jaesung Bae, Dongjoon Kwag, Hyeongjin Kim, and Wonjun Choe. "5‐2: Tracing‐Based Degradation Estimation Method for Stress‐Profile Algorithm." SID International Symposium Digest of Technical Papers 53, no. 1 (2022): 28-31. https://doi.org/10.1002/sdtp.15407.

MLA (9th ed.) Citation

Hong, Seokah, et al. "5‐2: Tracing‐Based Degradation Estimation Method for Stress‐Profile Algorithm." SID International Symposium Digest of Technical Papers, vol. 53, no. 1, 2022, pp. 28-31, https://doi.org/10.1002/sdtp.15407.