23‐4: Research on LCD Strength Improvement Based on Neural Networks Algorithm
Aiming at the display fragmentation caused by insufficient module strength of ultra-thin and narrow design, a module strength prediction model is proposed to improve LCDs strength immunity and provide design guide, The comparison between the experiment measurement and the predicted results shows tha...
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| Published in | SID International Symposium Digest of technical papers Vol. 55; no. 1; pp. 295 - 298 |
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| Main Authors | , , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Campbell
Wiley Subscription Services, Inc
01.06.2024
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| Subjects | |
| Online Access | Get full text |
| ISSN | 0097-966X 2168-0159 |
| DOI | 10.1002/sdtp.17513 |
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| Abstract | Aiming at the display fragmentation caused by insufficient module strength of ultra-thin and narrow design, a module strength prediction model is proposed to improve LCDs strength immunity and provide design guide, The comparison between the experiment measurement and the predicted results shows that the model can accurately predict the module strength under different design conditions and provide effective technical support and guidance. |
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| AbstractList | Aiming at the display fragmentation caused by insufficient module strength of ultra-thin and narrow design, a module strength prediction model is proposed to improve LCDs strength immunity and provide design guide, The comparison between the experiment measurement and the predicted results shows that the model can accurately predict the module strength under different design conditions and provide effective technical support and guidance. |
| Author | Yang, Sheng Liu, Wei Zhang, Zhi Zha, Guoping Geng, Yuxu Deng, Yong Sun, Yansheng Cheng, Yiming Li, Yucheng Zhang, Dayu |
| Author_xml | – sequence: 1 givenname: Yansheng surname: Sun fullname: Sun, Yansheng organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 2 givenname: Wei surname: Liu fullname: Liu, Wei organization: Lenovo (Shanghai) Electronic Technology Co., LTD – sequence: 3 givenname: Yong surname: Deng fullname: Deng, Yong organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 4 givenname: Guoping surname: Zha fullname: Zha, Guoping organization: Lenovo (Shanghai) Electronic Technology Co., LTD – sequence: 5 givenname: Yuxu surname: Geng fullname: Geng, Yuxu organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 6 givenname: Zhi surname: Zhang fullname: Zhang, Zhi organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 7 givenname: Dayu surname: Zhang fullname: Zhang, Dayu organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 8 givenname: Yiming surname: Cheng fullname: Cheng, Yiming organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 9 givenname: Yucheng surname: Li fullname: Li, Yucheng organization: Chongqing BOE Optoelectronics Technology Co., Ltd – sequence: 10 givenname: Sheng surname: Yang fullname: Yang, Sheng organization: Chongqing BOE Optoelectronics Technology Co., Ltd |
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| Cites_doi | 10.1889/1.1821377 10.1111/j.2041-1294.2011.00043.x 10.3969/j.issn.1004-373X.2010.14.015 |
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| References_xml | – volume: 46 start-page: 55 issue: 11 year: 2023 end-page: 59 article-title: Visual calibration method for weld seam tracking system based on neural network [J] publication-title: Modern Electronic Technology – year: 2000 – volume: 2 start-page: 39 issue: (1) year: 2011 end-page: 46 article-title: Edge strength testing of thin glasses[J] publication-title: International Journal of Applied Glass Science – volume: 35 start-page: 1597 issue: 1 year: 2004 end-page: 1599 – start-page: 18 year: 2011 – volume: 33 start-page: 4 issue: 14 year: 2010 article-title: Research of Recognition Technology for Glass Defect Based on BP Neural Network [J] publication-title: Modern Electronic Technology – volume: 35 start-page: 1593 issue: 1 year: 2004 end-page: 1595 article-title: 62.1: Mechanical Reliability of LCD Panels under Static Loading[C]//SID Symposium Digest of Technical Papers publication-title: Oxford, UK: Blackwell Publishing Ltd – year: 2010 – year: 2020 – volume-title: Taiwan FPD Expo 2000 year: 2000 ident: e_1_2_1_2_1 – start-page: 1597 volume-title: 62.2: Mechanical Reliability of LCD Panels under Dynamic Loading[C]//SID Symposium Digest of Technical Papers year: 2004 ident: e_1_2_1_6_1 – ident: e_1_2_1_3_1 doi: 10.1889/1.1821377 – ident: e_1_2_1_5_1 doi: 10.1111/j.2041-1294.2011.00043.x – volume-title: Sid International Symposium Digest of Technology Papers year: 2010 ident: e_1_2_1_8_1 – start-page: 18 volume-title: Overview of strength tests for LCD substrates and panels[C]//International Display Workshops year: 2011 ident: e_1_2_1_4_1 – ident: e_1_2_1_7_1 doi: 10.3969/j.issn.1004-373X.2010.14.015 – volume-title: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) year: 2020 ident: e_1_2_1_9_1 – volume: 46 start-page: 55 issue: 11 year: 2023 ident: e_1_2_1_10_1 article-title: Visual calibration method for weld seam tracking system based on neural network [J] publication-title: Modern Electronic Technology |
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| SubjectTerms | Algorithms Displays Finite element simulation Module strength Modules Neural network predictive model Neural networks Prediction models Predictions |
| Title | 23‐4: Research on LCD Strength Improvement Based on Neural Networks Algorithm |
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