An efficient active-stress electromechanical isogeometric shell model for muscular thin film simulations

We propose an isogeometric approach to model the deformation of active thin films using layered, nonlinear, Kirchhoff Love shells. Isogeometric Collocation and Galerkin formulations are employed to discretize the electrophysiological and mechanical sub-problems, respectively, with the possibility to...

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Published inarXiv.org
Main Authors Torre, Michele, Morganti, Simone, Nitti, Alessandro, Marco Donato de Tullio, Kiendl, Josef, Francesco Silvio Pasqualini, Reali, Alessandro
Format Paper Journal Article
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 11.06.2024
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ISSN2331-8422
DOI10.48550/arxiv.2406.07102

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Abstract We propose an isogeometric approach to model the deformation of active thin films using layered, nonlinear, Kirchhoff Love shells. Isogeometric Collocation and Galerkin formulations are employed to discretize the electrophysiological and mechanical sub-problems, respectively, with the possibility to adopt different element and time-step sizes. Numerical tests illustrate the capabilities of the active stress based approach to effectively simulate the contraction of thin films in both quasi-static and dynamic conditions.
AbstractList We propose an isogeometric approach to model the deformation of active thin films using layered, nonlinear, Kirchhoff Love shells. Isogeometric Collocation and Galerkin formulations are employed to discretize the electrophysiological and mechanical sub-problems, respectively, with the possibility to adopt different element and time-step sizes. Numerical tests illustrate the capabilities of the active stress based approach to effectively simulate the contraction of thin films in both quasi-static and dynamic conditions.
We propose an isogeometric approach to model the deformation of active thin films using layered, nonlinear, Kirchhoff Love shells. Isogeometric Collocation and Galerkin formulations are employed to discretize the electrophysiological and mechanical sub-problems, respectively, with the possibility to adopt different element and time-step sizes. Numerical tests illustrate the capabilities of the active stress based approach to effectively simulate the contraction of thin films in both quasi-static and dynamic conditions.
Author Nitti, Alessandro
Torre, Michele
Marco Donato de Tullio
Kiendl, Josef
Francesco Silvio Pasqualini
Morganti, Simone
Reali, Alessandro
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BackLink https://doi.org/10.48550/arXiv.2406.07102$$DView paper in arXiv
https://doi.org/10.1016/j.mechmat.2024.105046$$DView published paper (Access to full text may be restricted)
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Snippet We propose an isogeometric approach to model the deformation of active thin films using layered, nonlinear, Kirchhoff Love shells. Isogeometric Collocation and...
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Mathematics - Numerical Analysis
Thin films
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