Carbon nanotube circuits in the presence of carbon nanotube density variations - Zhang, Jie; Patil, Nishant; Hazeghi, Arash; Mitra, Subhasish (2009 46th ACM/IEEE Design Automation Conference, 2009)
Keywords: Atomic force microscopy; Carbon Nanotube; Carbon nanotubes; Circuit analysis; Circuit noise; Circuit synthesis; CNT; CNT Correlation; CNT Density Variation; CNTFETs; Delay effects; Hardware -- Integrated circuits; Noise reduction; Permission; Scanning electron microscopy; CNT; CNT density variation; CNT correlation; carbon nanotube