APA (7th ed.) Citation

Zhong, Z., Liu, J., Wu, D., Di, P., Sui, Y., Liu, A. X., & Lui, J. C. S. (2023, May). Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services. IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice (Online), 110-121. https://doi.org/10.1109/ICSE-SEIP58684.2023.00015

Chicago Style (17th ed.) Citation

Zhong, Zexin, Jiangchao Liu, Diyu Wu, Peng Di, Yulei Sui, Alex X. Liu, and John C. S. Lui. "Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services." IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice (Online) May. 2023: 110-121. https://doi.org/10.1109/ICSE-SEIP58684.2023.00015.

MLA (9th ed.) Citation

Zhong, Zexin, et al. "Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services." IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice (Online), May. 2023, pp. 110-121, https://doi.org/10.1109/ICSE-SEIP58684.2023.00015.