Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis - Wang, Zan; You, Hanmo; Chen, Junjie; Zhang, Yingyi; Dong, Xuyuan; Zhang, Wenbin (Proceedings / International Conference on Software Engineering, 2021)
Keywords: Companies; Computer bugs; Deep Learning Testing; Deep Neural Network; Label; Labeling; Mutation; Neural networks; Predictive models; Test Prioritization; Testing; Training