Turn-On Voltage Shift of Metal–Insulator–Oxide Semiconductor Thin-Film Diode by Adding Schottky Diode in Reverse Direction
Various efforts have been made to fabricate oxide thin-film diodes (TFDs) that will be applied to next-generation electronics to ensure thin, lightweight, and reliable operation. However, p–n-junction oxide TFDs are challenging to fabricate because of the absence of stable p-type oxide semiconductor...
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Published in | ACS applied electronic materials Vol. 1; no. 4; pp. 530 - 537 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
American Chemical Society
23.04.2019
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Subjects | |
Online Access | Get full text |
ISSN | 2637-6113 2637-6113 |
DOI | 10.1021/acsaelm.8b00138 |
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Abstract | Various efforts have been made to fabricate oxide thin-film diodes (TFDs) that will be applied to next-generation electronics to ensure thin, lightweight, and reliable operation. However, p–n-junction oxide TFDs are challenging to fabricate because of the absence of stable p-type oxide semiconductors, and metal–insulator–metal (MIM) diodes are inevitably subject to unnecessary power losses due to the high off-current induced by the thin insulator. Furthermore, the low rectification ratio and withstand voltage of MIM TFDs are also limits to overcome. Recently, a novel type of TFD with a metal–insulator–oxide semiconductor (MIOS) structure was reported. It shows a relatively high rectifying ratio, low off-current, and a stable withstand voltage. However, finding a way to shift the diode’s turn-on voltage for various specifications and applications of MIOS TFDs remains a challenge. Herein, we propose a novel approach to shift the turn-on voltage of MIOS TFDs. By adding a metal electrode to the oxide semiconductor, different shifts of the turn-on voltage of MIOS TFDs could be realized depending on the characteristic variation of the Schottky contact between the metal electrode and the oxide semiconductor. ZnO/Ag-based TFD shifted to 4.0 V because of the reverse Schottky diode formed on the oxide semiconductor. a-IGZO/Au-based TFD showed a turn-on voltage of 8.4 V. a-IGZO + AgO X /Ag-based TFD turned on at 12.8 V because of the enhanced Schottky property. These findings are expected to help develop diverse MIOS TFDs and expand their capabilities in the future. |
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AbstractList | Various efforts have been made to fabricate oxide thin-film diodes (TFDs) that will be applied to next-generation electronics to ensure thin, lightweight, and reliable operation. However, p–n-junction oxide TFDs are challenging to fabricate because of the absence of stable p-type oxide semiconductors, and metal–insulator–metal (MIM) diodes are inevitably subject to unnecessary power losses due to the high off-current induced by the thin insulator. Furthermore, the low rectification ratio and withstand voltage of MIM TFDs are also limits to overcome. Recently, a novel type of TFD with a metal–insulator–oxide semiconductor (MIOS) structure was reported. It shows a relatively high rectifying ratio, low off-current, and a stable withstand voltage. However, finding a way to shift the diode’s turn-on voltage for various specifications and applications of MIOS TFDs remains a challenge. Herein, we propose a novel approach to shift the turn-on voltage of MIOS TFDs. By adding a metal electrode to the oxide semiconductor, different shifts of the turn-on voltage of MIOS TFDs could be realized depending on the characteristic variation of the Schottky contact between the metal electrode and the oxide semiconductor. ZnO/Ag-based TFD shifted to 4.0 V because of the reverse Schottky diode formed on the oxide semiconductor. a-IGZO/Au-based TFD showed a turn-on voltage of 8.4 V. a-IGZO + AgO X /Ag-based TFD turned on at 12.8 V because of the enhanced Schottky property. These findings are expected to help develop diverse MIOS TFDs and expand their capabilities in the future. |
Author | Kim, Youn Sang Cho, Nam-Kwang Park, Jun-Woo Lee, Jinwon Lee, Donggun |
AuthorAffiliation | Program in Nano Science and Technology, Graduate School of Convergence Science and Technology Advanced Institute of Convergence Technology |
AuthorAffiliation_xml | – name: Program in Nano Science and Technology, Graduate School of Convergence Science and Technology – name: Advanced Institute of Convergence Technology |
Author_xml | – sequence: 1 givenname: Jun-Woo surname: Park fullname: Park, Jun-Woo organization: Program in Nano Science and Technology, Graduate School of Convergence Science and Technology – sequence: 2 givenname: Donggun surname: Lee fullname: Lee, Donggun organization: Program in Nano Science and Technology, Graduate School of Convergence Science and Technology – sequence: 3 givenname: Nam-Kwang surname: Cho fullname: Cho, Nam-Kwang organization: Program in Nano Science and Technology, Graduate School of Convergence Science and Technology – sequence: 4 givenname: Jinwon surname: Lee fullname: Lee, Jinwon email: johnn.lee@samsung.com – sequence: 5 givenname: Youn Sang orcidid: 0000-0002-4580-2037 surname: Kim fullname: Kim, Youn Sang email: younskim@snu.ac.kr organization: Advanced Institute of Convergence Technology |
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Keywords | indium-included oxide semiconductor silver electrode turn-on voltage shift reversed Schottky contact thin-film diode |
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Title | Turn-On Voltage Shift of Metal–Insulator–Oxide Semiconductor Thin-Film Diode by Adding Schottky Diode in Reverse Direction |
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