Vicis: a reliable network for unreliable silicon - Fick, David; DeOrio, Andrew; Hu, Jin; Bertacco, Valeria; Blaauw, David; Sylvester, Dennis (2009 46th ACM/IEEE Design Automation Conference, 2009)
Keywords: Built-in-Self-Test; Electric breakdown; Fault diagnosis; Fault tolerance; Hard Faults; N-Modular Redundancy; Network-on-a-chip; Network-on-Chip; Power system management; Reconfiguration; Redundancy; Silicon; System recovery; Telecommunication traffic; Testing; Torus; fault tolerance; torus; Network-on-Chip; hard faults; N-modular redundancy; reconfiguration; built-in-self-test