Circuit techniques for dynamic variation tolerance - Bowman, Keith; Tschanz, James; Wilkerson, Chris; Lu, Shih-Lien; Karnik, Tanay; De, Vivek; Borkar, Shekhar (2009 46th ACM/IEEE Design Automation Conference, 2009)
Keywords: Aging; Circuits; Degradation; Delay; Dynamic variations; Energy efficiency; Error correction; error detection; error recovery; error-detection sequential; Frequency; Hardware -- Emerging technologies; Hardware -- Very large scale integration design; Microprocessors; parameter variations; Permission; replica paths; resilient circuits; Temperature; timing errors; variation sensors; variation-tolerant circuits; parameter variations; resilient circuits; dynamic variations; error recovery; variation sensors; variation-tolerant circuits; replica paths; timing errors; error-detection sequential; error detection; error correction