IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors - Park, Sung-Boem; Mitra, Subhasish (2008 45th ACM/IEEE Design Automation Conference, 2008)
Keywords: Analytical models; Bridge circuits; Circuit simulation; Clocks; Computer bugs; Costs; debug; design for debug; Fault detection; Hardware; Hardware -- Hardware test; Hardware -- Hardware validation; Hardware -- Hardware validation -- Functional verification; Hardware -- Robustness; Information analysis; Reproducibility of results; Validation; verification; design for debug; debug; validation; verification