APA (7th ed.) Citation

Kundu, S., Ganai, M., & Gupta, R. (2008, June 8). Partial order reduction for scalable testing of systemC TLM designs. 2008 45th ACM/IEEE Design Automation Conference, 936-941. https://doi.org/10.1145/1391469.1391706

Chicago Style (17th ed.) Citation

Kundu, Sudipta, Malay Ganai, and Rajesh Gupta. "Partial Order Reduction for Scalable Testing of SystemC TLM Designs." 2008 45th ACM/IEEE Design Automation Conference 8 Jun. 2008: 936-941. https://doi.org/10.1145/1391469.1391706.

MLA (9th ed.) Citation

Kundu, Sudipta, et al. "Partial Order Reduction for Scalable Testing of SystemC TLM Designs." 2008 45th ACM/IEEE Design Automation Conference, 8 Jun. 2008, pp. 936-941, https://doi.org/10.1145/1391469.1391706.