Process variation tolerant SRAM array for ultra low voltage applications - Kulkarni, Jaydeep P.; Kim, Keejong; Park, Sang Phill; Roy, Kaushik (2008 45th ACM/IEEE Design Automation Conference, 2008)
Keywords: Application software; Dynamic voltage scaling; Feedback; Hardware -- Integrated circuits -- Semiconductor memory; Low voltage; Low voltage/sub-threshold SRAM; Power dissipation; Process Tolerance; Random access memory; Robustness; Schmitt Trigger SRAM; Testing; Threshold voltage; Trigger circuits; Schmitt trigger SRAM; process tolerance; low voltage/sub-threshold SRAM