Lai, Z., Cheung, S. C., & Chan, W. K. (2010). Detecting atomic-set serializability violations in multithreaded programs through active randomized testing. 2010 ACM/IEEE 32nd International Conference on Software Engineering, 1, 235-244. https://doi.org/10.1145/1806799.1806836
Chicago Style (17th ed.) CitationLai, Zhifeng, S. C. Cheung, and W. K. Chan. "Detecting Atomic-set Serializability Violations in Multithreaded Programs Through Active Randomized Testing." 2010 ACM/IEEE 32nd International Conference on Software Engineering 1 (2010): 235-244. https://doi.org/10.1145/1806799.1806836.
MLA (9th ed.) CitationLai, Zhifeng, et al. "Detecting Atomic-set Serializability Violations in Multithreaded Programs Through Active Randomized Testing." 2010 ACM/IEEE 32nd International Conference on Software Engineering, vol. 1, 2010, pp. 235-244, https://doi.org/10.1145/1806799.1806836.