Pattern generation for a deterministic BIST scheme - Hellebrand, Sybille; Reeb, Birgit; Tarnick, Steffen; Wunderlich, Hans-Joachim (Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design, 1995)
Keywords: Hardware -- Hardware test -- Test-pattern generation and fault simulation; ATPG; Test Synthesis; BIST