by Lu, Yanfei, Xie, Rui, Liang, Steven Y.
Published in International journal of advanced manufacturing technology (01.06.2019)

by Wu, Zhenyu, Lin, Wenfang, Fu, Binghao, Guo, Juchuan, Ji, Yang, Pecht, Michael
Published in IEEE transactions on reliability (01.12.2020)

by Long, Bing, Xian, Weiming, Li, Min, Wang, Houjun
Published in Neurocomputing (Amsterdam) (10.06.2014)

by Li, Huifang, Fan, Rui, Shi, Qisong, Du, Zijian
Published in Journal of advanced computational intelligence and intelligent informatics (01.05.2021)

by Lu, Sijia, Gao, Wei, Hong, Cui, Sun, Yiqun
Published in Advanced engineering informatics (01.08.2021)

by Chen, Yung-Yao, Jhong, Sin-Ye, Tu, Shao-Kai, Lin, Yu-Hsiu, Wu, Yi-Chen
Published in IEEE sensors journal (01.08.2024)

by Krishnakumari, A., Elayaperumal, A., Saravanan, M., Arvindan, C.
Published in International journal of advanced manufacturing technology (01.04.2017)

by Randall, R.B., Smith, W.A.
Published in Mechanical systems and signal processing (01.11.2019)

by Uvaysov, S. U., Chernoverskaya, V. V., Dao, An Kuan, Nguyen, Van Tuan
Published in Rossijskij tehnologičeskij žurnal (26.08.2021)

by Zhou, Zhou, Cheng, Xin, Chang, Hui, Zhou, Jingmei, Zhao, Xiangmo
Published in Computational intelligence and neuroscience (2021)

by Diversi, Roberto, Sandrolini, Leonardo, Simonazzi, Mattia, Speciale, Nicolò, Mariscotti, Andrea
Published in Electronics (Basel) (01.08.2024)

by Wang, Pingfeng, Tamilselvan, Prasanna, Hu, Chao
Published in Engineering applications of artificial intelligence (01.06.2014)

by Purpura-Pontoniere, Attiano, Bobrov, Maksim, Bhattacharya, Tarun
Year of Publication 14.06.2023

by Chou, Shih-Fan, Yen, Hsiu-Wen, Pang, Ai-Chun
Published in IEEE internet of things journal (01.06.2019)

by Liu, Xianhua, Liu, Qinghong
Published in Energy Informatics (01.12.2024)

by Benatia, Mohamed Amin, Chabane, Ahmed Nait, Sahnoun, M’hammed, Bettayeb, Belgacem
Published in Applied intelligence (Dordrecht, Netherlands) (01.02.2025)

by Yu, WenXin, Sui, Yongbo, Wang, Junnian
Published in Journal of electronic testing (01.08.2016)

by Rostami, Hamideh, Blue, Jakey, Yugma, Claude
Published in Applied soft computing (01.07.2018)

by Polverino, Pierpaolo, Elefante, Serena, Arsie, Ivan, Pianese, Cesare
Published in AIP conference proceedings (17.12.2019)

by Li, Yongbo, Wang, Xianzhi, Si, Shubin, Huang, Shiqian
Published in IEEE transactions on reliability (01.06.2020)