by Wynn, M.T., Verbeek, H.M.W., van der Aalst, W.M.P., ter Hofstede, A.H.M., Edmond, D.
Published in Business process management journal (01.01.2009)

Published in CAD/CAM Update (01.11.2019)

by Neebel, D.J., Kime, C.R.
Published in Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (1993)