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Integration of Soiling-Rate Measurements and Cleaning Strategies in Yield Analysis of Parabolic Trough Plants
Published in Journal of solar energy engineering
(01.08.2018)
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Journal Article
Intel-22nm Squelch Yield Analysis and Optimization
Shinde, Suhas Vishwasrao
Published in Lecture notes in engineering and computer science (01.01.2014)
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Published in Lecture notes in engineering and computer science (01.01.2014)
Journal Article
ÜRETİM YAPAN İŞLETMELERDE RANDIMAN ANALİZİ YOLUYLA DENETİM
Uzun Kocamış, Tuğçe
Published in Business & management studies: an international journal (30.10.2015)
Published in Business & management studies: an international journal (30.10.2015)
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Journal Article
Analysis, design, and control of Bernoulli production lines with waiting time constraints
Lee, Jun-Ho, Zhao, Cong, Li, Jingshan, Papadopoulos, Chrissoleon T.
Published in Journal of manufacturing systems (01.01.2018)
Published in Journal of manufacturing systems (01.01.2018)
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Journal Article
Review of Gould–Dincer reservoir storage–yield–reliability estimates
McMahon, Thomas A., Pegram, Geoffrey G.S., Vogel, Richard M., Peel, Murray C.
Published in Advances in water resources (01.09.2007)
Published in Advances in water resources (01.09.2007)
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Journal Article
Yield analysis with situations
MOSKEWICZ MATTHEW W, LAM MICHAEL C, LAI YAIEH, GENNARI FRANK E, MCINTYRE GREGORY R
Year of Publication 14.01.2014
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Year of Publication 14.01.2014
Patent
Yield analysis with situations
MOSKEWICZ MATTHEW W, LAM MICHAEL C, LAI YAIEH, GENNARI FRANK E, MCINTYRE GREGORY R
Year of Publication 09.02.2010
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Year of Publication 09.02.2010
Patent
Visual yield analysis of intergrated circuit layouts
LEE ALBERT, SRIVASTAVA RAJEEV, BHUSHAN BHARAT, PARUI MITHUNJOY, SHARMA HARSH DEV, KOMMOORI SRINIVAS R
Year of Publication 08.02.2011
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Year of Publication 08.02.2011
Patent
YIELD ANALYSIS SYSTEM AND METHOD USING SENSOR DATA OF FABRICATION EQUIPMENT
LEE JONG HO, LIM JONG SEUNG, AHN DAE JUNG, MIN SEUNG JAI, SHIN KAE YOUNG
Year of Publication 04.12.2014
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Year of Publication 04.12.2014
Patent
Dynamic inline yield analysis and prediction
JAWAHARLAL SUNDAR, SVIDENKO VICKY, SCHWARM ALEXANDER T, SHIMSHI RINAT, NEHMADI YOUVAL
Year of Publication 27.11.2008
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Year of Publication 27.11.2008
Patent
Yield analysis system and method using sensor data of fabrication equipment
LEE, JONG HO, SHIN, KAE YOUNG, LIM, JONG SEUNG, MIN, SEUNG JAI, AHN, DAE JUNG
Year of Publication 17.12.2014
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Year of Publication 17.12.2014
Patent