by Teng, Jeffrey W., Nergui, Delgermaa, Mensah, Yaw A., Ildefonso, Adrian, Cressler, John D.
Published in IEEE transactions on nuclear science (01.08.2024)

by Teng, Jeffrey W., Mensah, Yaw A., Brumbach, Zachary R., Ildefonso, Adrian, Khachatrian, Ani, McMorrow, Dale, Cressler, John D.
Published in IEEE transactions on nuclear science (01.04.2024)

by Al Seragi, Ebrahim M., Dash, Subhra, Muthuseenu, K., Cressler, John D., Barnaby, Hugh J., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Zeinolabedinzadeh, Saeed
Published in IEEE transactions on nuclear science (01.10.2022)

by Xu, Rui, Hsu, Chen-Kai, Kalani, Sarthak, Ban, Jaroslav, Wang, Qiang, Ochoa, Ines, Burton, Charles, Unal, Mesut, Sun, Nan, Kinget, Peter, Parsons, John, Andeen, Timothy
Published in IEEE transactions on nuclear science (01.04.2020)

by Krishna, Vaibhav, Deb, Senorita, Sahoo, Bibhu Datta
Published in Analog integrated circuits and signal processing (01.10.2021)

by Pratt, B, Fuller, M, Rice, M, Wirthlin, M
Published in 2010 IEEE International Conference on Communications (01.05.2010)

by Stempkovskiy, Alexander, Telpukhov, Dmitry, Solovyev, Roman A., Nadolenko, Vladislav
Published in IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (26.01.2021)

by Cereda, P.R.M., Zorzo, S.D.
Published in Revista IEEE América Latina (01.09.2008)

by Tanoue, S., Ishida, T., Ichinomiya, Y., Amagasaki, M., Kuga, M., Sueyoshi, T.
Published in International Conference on Field-programmable Logic and Applications (01.08.2009)

by Baloch, S., Arslan, T., Stoica, A.
Published in 2006 International Conference on Field Programmable Logic and Applications (01.08.2006)

by Destro-Filho, J.B., Matolak, D.W.
Published in 2001 6th European Conference on Radiation and Its Effects on Components and Systems (2001)

by Perez, Reinaldo
Published in IEEE transactions on electromagnetic compatibility (01.08.2008)

Published in Civil, Architecture and Environmental Engineering (2017)

by Sandeep, V., Pravin, J. Charles, Kumar, S. Ashok
Published in Microelectronics and reliability (01.08.2024)

by Alberton, S G, Medina, N H, Added, N, Aguiar, V A P, Menegasso, R, Macchione, E L A, Silveira, M A G
Published in Journal of physics. Conference series (01.07.2019)

by Simionovski, Alexandre, Vaz, Rafael G., Gonçalez, Odair L., Wirth, Gilson
Published in Journal of electronic testing (01.08.2015)

by Huang, Qiang, Jiang, Jin
Published in Progress in nuclear energy (New series) (01.07.2019)