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Directed-Graph-Learning-Based Diagnosis of Multiple Faults for High Speed Train With Switched Dynamics
Zhang, Kunpeng, Jiang, Bin, Chen, Fuyang, Yang, Hui
Published in IEEE transactions on cybernetics (01.03.2023)
Published in IEEE transactions on cybernetics (01.03.2023)
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Journal Article
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories
Mauroux, P.-D., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Godard, B., Festes, G., Vachez, L.
Published in Journal of electronic testing (01.04.2012)
Published in Journal of electronic testing (01.04.2012)
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Journal Article
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTACTM) eFlash Memories
Mauroux, P-d, Virazel, A, Bosio, A, Dilillo, L, Girard, P, Pravossoudovitch, S, Godard, B, Festes, G, Vachez, L
Published in Journal of electronic testing (01.04.2012)
Published in Journal of electronic testing (01.04.2012)
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Journal Article
Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories
Mauroux, Pierre-Didier, Virazel, Arnaud, Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Godard, Benoît, Feste, Gilles, Vachez, Laurent
Published in Journal of electronic testing (01.04.2012)
Published in Journal of electronic testing (01.04.2012)
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Journal Article
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
Spinks, S.J., Chalk, C.D., Bell, I.M., Zwolinski, M.
Published in Journal of electronic testing (01.02.2004)
Published in Journal of electronic testing (01.02.2004)
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Journal Article
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash
Ginez, O., Daga, J.-M., Girard, P., Landrault, C., Pravossoudovitch, S., Virazel, A.
Published in Journal of electronic testing (01.06.2009)
Published in Journal of electronic testing (01.06.2009)
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Journal Article
Space radiation effects in QCA binary wire
Mahdavi, M, Amiri, M A, Mirzakuchaki, S
Published in 2010 International Conference on Computer Applications and Industrial Electronics (01.12.2010)
Published in 2010 International Conference on Computer Applications and Industrial Electronics (01.12.2010)
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Conference Proceeding
Facilitating the design of fault tolerance in transaction level SystemC programs
Ebnenasir, Ali, Hajisheykhi, Reza, Kulkarni, Sandeep S.
Published in Theoretical computer science (22.07.2013)
Published in Theoretical computer science (22.07.2013)
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Journal Article
Safety in the event of an internal fault: modelling or tests?
Duquerroy, P, Friberg, G, Pietsch, G, Herault, C, Chevrier, P
Published in 14th International Conference and Exhibition on Electricity Distribution (CIRED 1997 - Distributing Power for the Millennium) (1997)
Published in 14th International Conference and Exhibition on Electricity Distribution (CIRED 1997 - Distributing Power for the Millennium) (1997)
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Conference Proceeding