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Invited: Enhancing Test Quality by Targeting Timing Marginalities Due to Process Variations
Singh, Adit D., Faridi, Mukarram Ali
Published in 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)
Published in 2025 62nd ACM/IEEE Design Automation Conference (DAC) (22.06.2025)
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