by Teng, Jeffrey W., Nergui, Delgermaa, Tzintzarov, George N., Ringel, Brett L., Brumbach, Zachary R., Heimerl, Justin P., Mensah, Yaw A., Moody, Jackson P., Thorbourn, Dennis O., Del Castillo, Linda, Mojarradi, Mohammad M., Blalock, Benjamin J., Cressler, John D.
Published in IEEE transactions on nuclear science (01.04.2023)

by Business Editors/High-Tech Writers
Published in Business Wire (03.09.2002)

by Al Seragi, Ebrahim M., Dash, Subhra, Muthuseenu, K., Cressler, John D., Barnaby, Hugh J., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Zeinolabedinzadeh, Saeed
Published in IEEE transactions on nuclear science (01.10.2022)

by Maiwald, Tim, Li, Teng, Hotopan, George-Roberto, Kolb, Katharina, Disch, Karina, Potschka, Julian, Haag, Alexander, Dietz, Marco, Debaillie, Björn, Zwick, Thomas, Aufinger, Klaus, Ferling, Dieter, Weigel, Robert, Visweswaran, Akshay
Published in Proceedings of the IEEE (01.03.2023)

by Kraft, J., Loffler, B., Knaipp, M., Wachmann, E.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)

by Xiaoke Kang, Xianjin Deng, Peng Cheng, Juan Su, Jun Jiang, Jiang Zhang
Published in International Conference on Infrared, Millimeter, and Terahertz Waves (Print) (01.09.2014)

by Salmeh, R., Maundy, B., Johnston, R.
Published in 2004 1st International Conference on Electrical and Electronics Engineering : (ICEEE) : Acapulco, Mexico, 8-10 September, 2004 (2004)

by Business Editors/High-Tech Writers
Published in Business Wire (24.10.2002)