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ML-based Fast On-Chip Transient Thermal Simulation for Heterogeneous 2.5D/3D IC Designs
Kumar, Akhilesh, Chang, Norman, Geb, David, He, Haiyang, Pan, Stephen, Wen, Jimin, Asgari, Saeed, Abarham, Mehdi, Ortiz, Chris
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
5G Evolution and 6G
Nakamura, Takehiro
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (01.08.2020)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (01.08.2020)
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Conference Proceeding
Substrate Signal Routing Solution Exploration for High-Density Packages with Machine Learning
Yeh, Yeu-Haw, Chen, Simon Yi-Hung, Chen, Hung-Ming, Tu, Deng-Yao, Fang, Guan-Qi, Kuo, Yun-Chih, Chen, Po-Yang
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
2.5D & 3DIC Advanced Packaging: An EDA Perspective
Hsu, Vincent
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
A Silicon Photonics Technology for 400 Gbit/s Applications
Lin, Ming-Wei
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
Challenges and Opportunities in Building Secure IoT Platforms
Chan, Tung-Yi
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
Robust CNFET Circuit Sizing Optimization
Heshmatpour, Zahra, Zhang, Lihong, Heys, Howard M.
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
Low-power Continuous-time Delta-sigma ADCs
Chae, Youngcheol
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
Performance Optimization for MLP Accelerators using ILP-Based On-Chip Weight Allocation Strategy
Fan, Kang-Yi, Chen, Jyun-Hua, Liu, Chien-Nan, Huang, Juinn-Dar
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
Technology Challenges to IC Industry for Next Decade
Loh, K. Lawrence
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
An 1-bit by 1-bit High Parallelism In-RRAM Macro with Co-Training Mechanism for DCNN Applications
Liu, Chi, Li, Shao- Tzu, Pan, Tong-Lin, Ni, Cheng-En, Sung, Yun, Hu, Chia-Lin, Chang, Kang-Yu, Hou, Tuo-Hung, Chang, Tian-Sheuan, Jou, Shyh-Jye
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
Introduction of Noise-Shaping SAR ADCs
Shu, Yun-Shiang
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
A64FX: 52 Core Processor Designed for the Supercomputer Fugak
Tabata, Takekazu
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding
28-m W Fully Embedded AI Techniques with On-site Learning for Low-Power Handy Tactile Sensing System
Yano, Yuji, Iwamoto, Hisashi, Yoshimura, Takuma, Nishida, Yoshihiro, Mori, Tatsuya, Komoku, Kiyotaka, Takao, Hidekuni, Arimoto, Kazutami
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
Published in Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (18.04.2022)
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Conference Proceeding