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The Past, the Present, and the Future of Ferroelectric Memories
Mikolajick, T., Schroeder, U., Slesazeck, S.
Published in IEEE transactions on electron devices (01.04.2020)
Published in IEEE transactions on electron devices (01.04.2020)
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Journal Article
GaN-on-Si Power Technology: Devices and Applications
Chen, Kevin J., Haberlen, Oliver, Lidow, Alex, Chun Lin Tsai, Ueda, Tetsuzo, Uemoto, Yasuhiro, Yifeng Wu
Published in IEEE transactions on electron devices (01.03.2017)
Published in IEEE transactions on electron devices (01.03.2017)
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Journal Article
Critical Role of Interlayer in Hf0.5Zr0.5O2 Ferroelectric FET Nonvolatile Memory Performance
Ni, Kai, Sharma, Pankaj, Zhang, Jianchi, Jerry, Matthew, Smith, Jeffery A., Tapily, Kandabara, Clark, Robert, Mahapatra, Souvik, Datta, Suman
Published in IEEE transactions on electron devices (01.06.2018)
Published in IEEE transactions on electron devices (01.06.2018)
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Journal Article
Phase-Change Memory-Towards a Storage-Class Memory
Fong, Scott W., Neumann, Christopher M., Wong, H.-S Philip
Published in IEEE transactions on electron devices (01.11.2017)
Published in IEEE transactions on electron devices (01.11.2017)
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Journal Article
Experimental Demonstration and Tolerancing of a Large-Scale Neural Network (165 000 Synapses) Using Phase-Change Memory as the Synaptic Weight Element
Burr, Geoffrey W., Shelby, Robert M., Sidler, Severin, di Nolfo, Carmelo, Junwoo Jang, Boybat, Irem, Shenoy, Rohit S., Narayanan, Pritish, Virwani, Kumar, Giacometti, Emanuele U., Kurdi, Bulent N., Hyunsang Hwang
Published in IEEE transactions on electron devices (01.11.2015)
Published in IEEE transactions on electron devices (01.11.2015)
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Journal Article
The Influence of Top and Bottom Metal Electrodes on Ferroelectricity of Hafnia
Lee, Yongsun, Goh, Youngin, Hwang, Junghyeon, Das, Dipjyoti, Jeon, Sanghun
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
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Journal Article
Magnetoresistive Random Access Memory: Present and Future
Ikegawa, Sumio, Mancoff, Frederick B., Janesky, Jason, Aggarwal, Sanjeev
Published in IEEE transactions on electron devices (01.04.2020)
Published in IEEE transactions on electron devices (01.04.2020)
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Journal Article
High Endurance Ferroelectric Hafnium Oxide-Based FeFET Memory Without Retention Penalty
Ali, T., Polakowski, P., Riedel, S., Buttner, T., Kampfe, T., Rudolph, M., Patzold, B., Seidel, K., Lohr, D., Hoffmann, R., Czernohorsky, M., Kuhnel, K., Steinke, P., Calvo, J., Zimmermann, K., Muller, J.
Published in IEEE transactions on electron devices (01.09.2018)
Published in IEEE transactions on electron devices (01.09.2018)
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Journal Article
Novel Vertical Channel-All-Around (CAA) In-Ga-Zn-O FET for 2T0C-DRAM With High Density Beyond 4F2 by Monolithic Stacking
Duan, Xinlv, Huang, Kailiang, Feng, Junxiao, Niu, Jiebin, Qin, Haibo, Yin, Shihui, Jiao, Guangfan, Leonelli, Daniele, Zhao, Xiaoxuan, Wang, Zhaogui, Jing, Weiliang, Wang, Zhengbo, Wu, Ying, Xu, Jeffrey, Chen, Qian, Chuai, Xichen, Lu, Congyan, Wang, Wenwu, Yang, Guanhua, Geng, Di, Li, Ling, Liu, Ming
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Vertical β-Ga₂O₃ Power Transistors: A Review
Wong, Man Hoi, Higashiwaki, Masataka
Published in IEEE transactions on electron devices (01.10.2020)
Published in IEEE transactions on electron devices (01.10.2020)
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Journal Article
Artificial Neural Network-Based Compact Modeling Methodology for Advanced Transistors
Wang, Jing, Kim, Yo-Han, Ryu, Jisu, Jeong, Changwook, Choi, Woosung, Kim, Daesin
Published in IEEE transactions on electron devices (01.03.2021)
Published in IEEE transactions on electron devices (01.03.2021)
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Journal Article
Superjunction Power Devices, History, Development, and Future Prospects
Udrea, Florin, Deboy, Gerald, Fujihira, Tatsuhiko
Published in IEEE transactions on electron devices (01.03.2017)
Published in IEEE transactions on electron devices (01.03.2017)
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Journal Article
Device and Circuit-Level Assessment of GaSb/Si Heterojunction Vertical Tunnel-FET for Low-Power Applications
Tripathy, Manas Ranjan, Singh, Ashish Kumar, Samad, A., Chander, Sweta, Baral, Kamalaksha, Singh, Prince Kumar, Jit, Satyabrata
Published in IEEE transactions on electron devices (01.03.2020)
Published in IEEE transactions on electron devices (01.03.2020)
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Journal Article
Review on SiC MOSFETs High-Voltage Device Reliability Focusing on Threshold Voltage Instability
Puschkarsky, K., Grasser, T., Aichinger, T., Gustin, W., Reisinger, H.
Published in IEEE transactions on electron devices (01.11.2019)
Published in IEEE transactions on electron devices (01.11.2019)
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Journal Article
Current Status and Opportunities of Organic Thin-Film Transistor Technologies
Xiaojun Guo, Yong Xu, Ogier, Simon, Tse Nga Ng, Caironi, Mario, Perinot, Andrea, Ling Li, Jiaqing Zhao, Wei Tang, Sporea, Radu A., Nejim, Ahmed, Carrabina, Jordi, Cain, Paul, Feng Yan
Published in IEEE transactions on electron devices (01.05.2017)
Published in IEEE transactions on electron devices (01.05.2017)
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Journal Article