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Novel test patterns for analog/mixed signal device reliability and electrical parameter extraction
송형섭, 권성규, 김제영, 오동준, 이정찬, 이희덕
Published in IDEC Journal of Integrated Circuits and Systems, 3(1) (01.01.2017)
Published in IDEC Journal of Integrated Circuits and Systems, 3(1) (01.01.2017)
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Journal Article