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Robustness diagrams based optimal design of run-to-run control subject to deterministic and stochastic disturbances

by Hwang, Shyh-Hong, Lin, Jui-Chi, Wang, Hsin-Chun
Published in Journal of process control (01.03.2018)

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Journal Article

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A self-tuning run-by-run process controller for processes subject to random disturbances

by Guo, Ruey-Shan, Chen, Jin-Jung, Chen, Argon, Lu, Shui-Shong
Published in Journal of the Chinese Institute of Engineers (01.07.1999)

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Journal Article

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Medical data system based on risk and UCON access control model

by CHEN XUE, JIANG RONG
Year of Publication 05.08.2022

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Patent