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A semi-automated real-time gamma radiation response measurement system for semiconductor device characterisation
Mu Yifei, Qi Yanfei, Lam Sang, Zhao Cezhou
Published in 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) (01.07.2015)
Published in 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) (01.07.2015)
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Conference Proceeding
Role of Injection Barrier in Capacitance-Voltage Measurements of Organic Devices
Nigam, Akash, Nair, Pradeep R., Premaratne, Malin, Rao, V. Ramgopal
Published in IEEE electron device letters (01.05.2014)
Published in IEEE electron device letters (01.05.2014)
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Journal Article