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Influence of Heavy Ion Irradiation on Perpendicular-Anisotropy CoFeB-MgO Magnetic Tunnel Junctions
Kobayashi, Daisuke, Kakehashi, Yuya, Hirose, Kazuyuki, Onoda, Shinobu, Makino, Takahiro, Ohshima, Takeshi, Ikeda, Shoji, Yamanouchi, Michihiko, Sato, Hideo, Enobio, Eli Christopher, Endoh, Tetsuo, Ohno, Hideo
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Soft errors in 10-nm-scale magnetic tunnel junctions exposed to high-energy heavy-ion radiation
Kobayashi, Daisuke, Hirose, Kazuyuki, Makino, Takahiro, Onoda, Shinobu, Ohshima, Takeshi, Ikeda, Shoji, Sato, Hideo, Enobio, Eli Christopher Inocencio, Endoh, Tetsuo, Ohno, Hideo
Published in Japanese Journal of Applied Physics (01.08.2017)
Published in Japanese Journal of Applied Physics (01.08.2017)
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Journal Article
Creation and functionalization of defects in SiC by proton beam writing
Ohshima, T., Honda, T., Onoda, S., Makino, T., Haruyama, M., Kamiya, T., Satoh, T., Hijikata, Y., Kada, W., Hanaizumi, O., Lohrmann, A., Klein, J. R., Johnson, B. C., McCallum, J. C., Castelletto, S., Gibson, B. C., Kraus, H., Dyakonov, V., Astakhov, G. V.
Published in Materials science forum (15.05.2017)
Published in Materials science forum (15.05.2017)
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Conference Proceeding
Journal Article
Change in Characteristics of SiC MOSFETs by Gamma-Ray Irradiation at High Temperature
Yokoseki, Takashi, Murata, Koichi, Ohshima, Takeshi, Kandori, Mikio, Abe, Hiroshi, Matsuda, Takuma, Takeyama, Akinori, Mitomo, Satoshi, Onoda, Shinobu, Yoshie, Toru, Hijikata, Yasuto, Tanaka, Yuki, Makino, Takahiro
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
Gamma-Ray Irradiation Response of the Motor-Driver Circuit with SiC MOSFETs
Kobayashi, Yugo, Murata, Koichi, Takeyama, Akinori, Kaneko, Yasuyoshi, Onoda, Shinobu, Ohshima, Takeshi, Matsuda, Takuma, Kandori, Mikio, Hachisuka, Michihiro, Mitomo, Satoshi, Hijikata, Yasuto, Makino, Takahiro, Tanaka, Yuki, Yokozeki, Takashi, Yoshie, Toru
Published in Materials Science Forum (01.05.2016)
Published in Materials Science Forum (01.05.2016)
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Journal Article
LET Dependence of Single Event Transient Pulse-Widths in SOI Logic Cell
Makino, T., Kobayashi, D., Hirose, K., Yanagawa, Y., Saito, H., Ikeda, H., Takahashi, D., Ishii, S., Kusano, M., Onoda, S., Hirao, T., Ohshima, T.
Published in IEEE transactions on nuclear science (01.02.2009)
Published in IEEE transactions on nuclear science (01.02.2009)
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Journal Article
Soft-Error Rate in a Logic LSI Estimated From SET Pulse-Width Measurements
Makino, T., Kobayashi, D., Hirose, K., Takahashi, D., Ishii, S., Kusano, M., Onoda, S., Hirao, T., Ohshima, T.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Experimental Verification of Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems
Yanagawa, Y., Kobayashi, D., Hirose, K., Makino, T., Saito, H., Ikeda, H., Onoda, S., Hirao, T., Ohshima, T.
Published in IEEE transactions on nuclear science (01.08.2009)
Published in IEEE transactions on nuclear science (01.08.2009)
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Journal Article
Radiation damages of InGaAs photodiodes by high-temperature electron irradiation
Ohyama, H., Takakura, K., Nakabayashi, M., Hirao, T., Onoda, S., Kamiya, T., Simoen, E., Claeys, C., Kuboyama, S., Oka, K., Matsuda, S.
Published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms (01.06.2004)
Published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms (01.06.2004)
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Journal Article