Vyzkoušejte nový nástroj s podporou AI
Summon Research Assistant
BETA
Revealing the structural degradation mechanism of the Ni-rich cathode surface: How thick is the surface?
Kang, Yoon-Sok, Park, Seong Yong, Ito, Kimihiko, Kubo, Yoshimi, Shin, Yongwoo, Kim, Dong Young, Seo, Dong-Hwa, Kim, Soojin, Park, Jin-Hwan, Doo, Seok-Gwang, Koh, Meiten, Seo, Jin Ah, Park, Kwangjin
Published in Journal of Power Sources (01.04.2021)
Published in Journal of Power Sources (01.04.2021)
Get full text
Journal Article
STEM-EELS Investigation of Planar Defects in Olivine in the Allende Meteorite
Marinova, Maya, Leroux, Hugues, Cuvillier, Priscille, Gloter, Alexandre, Jacob, Damien
Published in Minerals (Basel) (01.01.2021)
Published in Minerals (Basel) (01.01.2021)
Get full text
Journal Article
In Depth Study of Ge Impact on Advanced SiGe PMOS Transistors
Soussou, Assawer, Cassé, Mikael, Reimbold, Gilles, Leroux, Charles, Andrieu, François, Rideau, Denis, Delaye, Vincent, Juhel, Marc, Berthelon, Remy, Ghibaudo, Gerard, Tavernier, Clément
Published in Meeting abstracts (Electrochemical Society) (05.08.2014)
Published in Meeting abstracts (Electrochemical Society) (05.08.2014)
Get full text
Journal Article
Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
Shunsuke Yamashita, Sei Fukushima, Jun Kikkawa, Ryoji Arai, Yuya Kanitani, Koji Kimoto, Yoshihiro Kudo
Published in APL Materials (01.03.2024)
Published in APL Materials (01.03.2024)
Get full text
Journal Article
Quantitative HAADF-STEM and EELS
Susanne Stemmer, Scott D. Findlay, Leslie J. Allen, James M. LeBeau
Published in Microscopy and Microanalysis (01.08.2008)
Published in Microscopy and Microanalysis (01.08.2008)
Get full text
Journal Article