Applied Optical Metrology IV

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on Applied Optical Metrology IV held on 1-5 August 2021, San Diego, California, United S...

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Bibliographic Details
Format: eBook
Language: Undetermined
Published: Bellingham, Washington : SPIE / International Society for Optical Engineering, 2021.
Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 11817.
Subjects:
Metrology.
Optical measurements.
elektronické knihy
electronic books
ISBN: 9781510644724
9781510644731
1510644733
Physical Description: 1 online resource

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Table of contents

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245 0 0 |a Applied Optical Metrology IV /  |c edited by Erik Novak, James D. Trolinger, Christopher C. Wilcox. 
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650 0 |a Metrology. 
650 0 |a Optical measurements. 
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830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 11817. 
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