X-Ray Nanoimaging: Instruments and Methods V
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, Cali...
Saved in:
| Format | Electronic eBook |
|---|---|
| Language | Undetermined |
| Published |
SPIE / International Society for Optical Engineering
2021.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9781510645165 9781510645172 1510645179 |
| Physical Description | 1 online resource |
Cover
| LEADER | 00000cam a2200000M 4500 | ||
|---|---|---|---|
| 001 | kn-on1302269221 | ||
| 003 | OCoLC | ||
| 005 | 20240717213016.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 220218s2021 xx o ||| 0 und d | ||
| 040 | |a LVT |b eng |c LVT |d SFB |d OCLCF |d OCLCO |d OCLCL | ||
| 020 | 0 | |z 9781510645165 | |
| 020 | 0 | |a 9781510645172 |q (online) | |
| 020 | |a 1510645179 | ||
| 035 | |a (OCoLC)1302269221 |z (OCoLC)1295581199 | ||
| 245 | 0 | 0 | |a X-Ray Nanoimaging: Instruments and Methods V |h [electronic resource]. |
| 260 | |b SPIE / International Society for Optical Engineering |c 2021. | ||
| 300 | |a 1 online resource | ||
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 520 | |a Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, California, United States. | ||
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a X-ray microscopy. | |
| 650 | 0 | |a X-ray optics. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpXNIMV002/x-ray-nanoimaging?kpromoter=marc |y Full text |