X-Ray Nanoimaging: Instruments and Methods V

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, Cali...

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Bibliographic Details
Format: Electronic
Language: Undetermined
Published: SPIE / International Society for Optical Engineering 2021.
Subjects:
X-ray microscopy.
X-ray optics.
elektronické knihy
electronic books
ISBN: 9781510645165
9781510645172
1510645179
Physical Description: 1 online resource

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020 0 |z 9781510645165 
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245 0 0 |a X-Ray Nanoimaging: Instruments and Methods V  |h [electronic resource]. 
260 |b SPIE / International Society for Optical Engineering  |c 2021. 
300 |a 1 online resource 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, California, United States. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a X-ray microscopy. 
650 0 |a X-ray optics. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpXNIMV002/x-ray-nanoimaging?kpromoter=marc  |y Full text 

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